选区衍射

  • 网络SAD;SAED;SADIFF;SAFD
选区衍射选区衍射
  1. 电子显微探针分析仪用X射线衍射仪、射电镜及其选区衍射来分析薄膜的微结构。

    The microstructure of the film was characterized by X ray diffraction , transmission electron microscopy , and selected area diffraction .

  2. 用X射线衍射和透射电子选区衍射分析LiNi0.7Co0.25Al0.05O2的晶体结构。

    The phase structure of LiNi_ ( 0.7 ) Co_ ( 0.25 ) Al_ ( 0.05 ) O_2 was identified by X-ray diffraction and transmission electron selected area diffraction .

  3. 在研究中,还应用TEMSEM及TEMSAD(选区衍射)对试样的同一位置进行同步原位分析。

    Techniques of synchronized analysis at the same position of specimens by TEM / SAD ( selected area electron diffraction ) or SEM / TEM are also used .

  4. 根据EDX以及选区衍射确定了产物为一维Cu-Zn-Al合金纳米结构。

    The selected area electron diffraction and EDX analyze is confirm that the products are one-dimensional Cu-Zn-Al alloy nano-structures .

  5. 用扫描电镜和透射电镜对经1100℃煅烧20min的硅藻土的微观结构和显微结构进行了形貌、电子探针、选区衍射、能谱分析等多种技术的综合分析。

    The micrographs and microstructure of diatomite calcined at 1100 ℃ for 20 mi-nutes were studied by using SEM and TEM .

  6. 本工作仅在一只试样的选区衍射花样中有弧形衍射斑,这最可能是TiH2析出的结果。

    Only one specimen was revealed the arced spots in the selected area electron diffraction pattern which may be caused by the precipitation of TiH_2 .

  7. 用透射电子显微镜观察了氢化物析出相的形貌特征,并利用选区衍射技术判定了氢化物的类型。

    Meanwhile , the microstructure and type of hydride precipitation were examined by TEM .

  8. 经透射电镜明场形貌和电子选区衍射证实白亮层为非晶组织激光非晶化时熔池底部晶态基体的外延生长是影响非晶化的最关键因素。

    It is demonstrated in the paper that epitaxial growth from the crystalline substrate at melt bottom is the most critical factor during laser glazing .

  9. 用选区衍射斑点对晶体结构的点阵象作数字处理已成功地应用于蒸发金膜和羟基磷灰石人齿釉质的结构分析上。

    Digital processing of lattice images in crystal structures from the selected diffraction spots is successfully developed to the structural analysis of evaporated gold and human tooth enamel of hydroxyapatite .

  10. 第五章是透射电镜选区衍射电子花样图像的结构分析,利用面向对象程序设计技术和数据库技术并结合透射电镜衍射图像分析方法对电子衍射花样进行标定。

    Chapter 5 introduces the structure demarcate method of the diffraction images which is founded on the basis of Electron Microscope Analysis theory , combining the knowledge of visual c + + and database .

  11. 不同晶相草酸钙晶体的选区电子衍射和X射线衍射比较分析

    Comparative Analysis on Various Calcium Oxalate Hydrates by SAED and XRD

  12. 选区电子衍射和X射线衍射表征显示,所形成的矿化晶体主要为多晶形态的羟基磷灰石。

    SAED and XRD results showed the crystals were mainly polycrystal hydroxyapatite .

  13. 采用类凝胶超临界流体干燥法制备了超细MoCoK催化剂,并运用TEM和选区电子衍射技术对制得的催化剂进行了表征。

    Ultrafine Mo Co K catalysts were prepared by the " gel like " method followed by supercritical fluid drying technique .

  14. 运用TEM技术观察了两种粉体的形貌,并给出了选区电子衍射图;

    The particles were observed by TEM and the selected area electron diffraction patterns of nickel powders were shown ;

  15. 本文利用X射线粉末照相法及透射电子显微镜选区电子衍射法,唯一地确定了作者在液态急冷Fe-12.6at%B合金中发现的新亚稳相具有六角点阵。

    The lattice structure of a new metastable phase in Fe-12.6 at % B alloy produced by splat-melting has been determined by X-ray diffraction and electron diffraction .

  16. 选区电子衍射(SAD)和X射线能量色散谱(EDAX)分析证实,壳-芯结构是由晶粒中含杂质Si的分布不均匀引起。

    SED and EDAX results show that the shell-core structure may be caused by the nonuniform distribution of silicon impurities in grains .

  17. XRD,RAMAN和选区电子衍射花样分析表明纳米复合材料中的TiO2为锐钛型。

    The experiments of XRD , RAMAN , and selected area electron diffraction pattern showed the anatase of TiO2 in the TiO2 / Eu-MCM .

  18. AFM和拉曼光谱证实所得到的晶粒是均匀的单层石墨烯,选区电子衍射以及偏光显微镜证实石墨烯晶粒为单晶结构。

    AFM , Raman spectra , SAED , and POM showed that the submillimeter graphene grains were monolayer single crystals .

  19. 应用扫描电子显微镜、透射电子显微镜、能量损失谱(EDS)和选区电子衍射(SAD)等方法对纳米线化学组成和结构进行了分析和表征。

    The nanowires are analyzed by scanning electron microscopy , transmission electron microscopy , energy dispersive spectroscopy and low-energy electron diffraction methods .

  20. 并用透射电镜、选区电子衍射、X射线衍射、X射线光电子能谱对所制得的粉末进行了表征。

    The transmission electron microscope ( TEM ), selected area electron diffraction ( SAED ), X-ray diffraction ( XRD ) and X-ray photoelectron spectrometry ( XPS ) were used to characterize the ZnO nano-powder .

  21. 用透射电镜选区电子衍射(TEM)方法测试了导模法生长的白宝石单晶体的晶体结构和点阵常数。

    The crystal structure and its lattice parameter of sapphire single crystal grown by EFG method was determined by selected area diffraction of transmission electron micrograph ( TEM ) .

  22. 采用差示扫描量热分析、X射线衍射分析、配有选区电子衍射的高分辨电镜分析等测试手段,研究了富Al非晶合金的晶化过程及其部分晶化的微观结构。

    Crystallization behavior of Al-rich metallic glass and its partial crystallized microstructural characteristics were examined by means of differential scanning calorimetric , conventional X-ray diffraction and high resolution transmission electron microscopy with selected-area electron diffraction .

  23. X射线衍射、高分辨透射电子显微镜、选区电子衍射和X射线光电子能谱分析表明,制备态的CoxC100-x颗粒膜由~2nm的非晶Co颗粒分散在非晶C母体中组成。

    XRD , HRTEM , SAED , and XPS analyses show that the as-deposited Co-C granular films consist of ~ 2 nm amorphous Co granules embedded in amorphous C matrix .

  24. 采用X射线、扫描电镜、透射电镜及选区电子衍射等手段研究了45钢表面WC/Ni金属陶瓷激光涂覆层的组织结构及形成机制。

    Microstructure and formation mechanism of laser cladded WC / Ni metal ceramics on 45 steel has been investigated with X-ray , scanning electron microscopy , transmitting electron microscopy and selected area electronic diffraction techniques , etc.

  25. 用透射电镜(TEM)观察螺旋形碳晶须的微观形貌,并作选区电子衍射,分析其结构,可知螺旋形碳晶须的结构为六方晶体。

    Using the TEM to observe the micro shape of coiled carbon whiskers , and analyze their structure by electron diffraction , it can be informed that its structure is hexagonal crystal .

  26. 内部的石棉纤维及其外部的碳管均经过X射线能量损失谱(EDX)的成份分析及选区电子衍射(SAED)的结构分析加以证实。

    Energy-dispersive X-ray spectroscopy ( EDX ) and selected-area electron diffraction ( SAED ) analyses pro-vide definite evidences for asbestos fibres encapsulated by carbon tubes .

  27. 本文利用TEM原位加热手段和选区电子衍射分析方法,对纳米晶Pd-Si薄膜在加热过程中析出的相进行了研究。

    The precipitated phases of the nanocrystalline Pd-Si films which are prepared by evaporating Pd_ ( 80 ) Si_ ( 20 ) alloys have been studied by means of TEM in-situ heating and selected electron diffraction .

  28. 透射电镜(TEM)研究发现了Gd5Si2Ge2相的基体上存在两种不同形态的线条组织,选区电子衍射证明两种不同形态的线条组织既非第二相也非孪晶;

    Two types of line features are found in the fine microstructure of Gd_5Si_2Ge_2-type phase by TEM . Selected area diffraction ( SAD ) confirms that both line features are not the secondary phase or twins .

  29. 另一套为已知晶系情况下应用CBED测定晶体点群的实验流程图,它适用于已有X射线衍射或选区电子衍射数据的情况。

    The second is a special flow chart for point group determination by CBED when the crystal system of the specimen have been determined by XRD or SAED .

  30. 所得产物用X射线粉末衍射、X射线能量色散谱、透射电子显微镜、高分辨电子显微镜、选区电子衍射、扫描电子显微镜、紫外-可见吸收光谱进行了表征。

    The products were characterized by X-ray powder diffraction ( XRD ), energy dispersive spectroscopy ( EDS ), transmission electron microscope ( TEM ), high-resolution electron microscope ( HRTEM ), selected area electron diffraction ( SAED ), scanning electron microscope ( SEM ) .