多晶硅片

  • 网络Polycrystalline silicon wafer;Multi Crystalline Silicon Patch
多晶硅片多晶硅片
  1. 多晶硅片常见的缺陷有边缘不纯、高不纯度、位错缺陷,单晶硅片常见的缺陷有漩涡缺陷。

    Common defects in polysilicon slice are edge impure , high impurity and dislocation defects , common defects in monocrystalline slice are whirlpool defects .

  2. 最后构造出缺陷检测分类树模型,实现缺陷的检测分类,对多晶硅片的三种缺陷采用排除法依次检测。

    Based on decision tree classification method , constructed classification tree model , to design an open-threshold classification method to achieve defects detection and classification . For three defects in polycrystalline silicon slice , using exclusion method to detect sequentially .

  3. 用于太阳能电池的多晶硅锭片晶体学特征研究

    Crystallographic Features Study of Polycrystalline Silicon Ingot for Solar Cells

  4. RICHSOLAR主要产品为单晶、多晶硅太阳能电池片、组件。

    The main products from RICH SOLAR are mono-crystalline and polycrystalline solar cells and solar modules .

  5. 多晶硅太阳能电池片由于内部存在晶界等缺陷使得转换效率只比单晶硅太阳能电池片略低,而由于光照受地区、天气的影响,实际使用差距不大。

    The conversion efficiency of multi-crystalline silicon solar cells are only slightly lower than the monocrystalline silicon solar cells . However , the sun light under the influence of position and weather , they are almost the same .