干涉显微镜

系统由干涉显微镜、数字CCD摄像头和计算机组成。

The system consists of an interference microscope , a digital CCD video camera and a computer .

6J型干涉显微镜测量表面粗糙度的CAI软件设计

Design of CAI of Measuring Roughness of the Surfaces with 6J Interference Microscope

借助微分干涉显微镜（NIC）对贝氏隐孢子虫（C.baileyi）在鸡胚CAM上的发育过程进行了研究。

The life-cycle of C. baileyi in the CAM of chicken embryo was studied by the Nomarski interference-contrast microscopy ( NIC ) .

高阶纤维的结构进行了研究，WAXD，SAXS的手段，干涉显微镜和MDSC。

Higher-order structure of fibers was investigated by means of WAXD , SAXS , interference microscope and MDSC .

利用双圈接触测角仪、双圈反射测角仪、微分干涉显微镜等测试手段，对不同条件下水热法生长的KTP晶体的宏观形态及各族晶面的微观形貌特征进行了观察和描述。

The study focuses on the crystal morphology and surface structures of hydrothermal KTP crystals with double coil reflecting goniometer , double coil hand - goniometer and differential interference microscope .

干涉显微镜法是一种获取表面形貌特征的光学测量技术，在半导体器件、光学加工、MEMS技术和微纳米材料分析领域广泛应用。

Optical interference microscopy is a typical technique for obtaining surface morphology and is extensively applied for the semiconductor devices , the optical processing , MEMS ( Micro Electronic Mechanical System ) technology and micro-and nano - materials analysis .

方法图像增强的微分干涉显微镜（VEC-DIC）被用来观察给予刺激因素前后细胞形态的改变。

The video-enhanced contrast differential interference contrast ( VEC-DIC ) microscopy was used to observe cell shapes before and after application of the stimuli .

微分相衬干涉显微镜定量测量表面形貌可定量测量的透射式微分干涉显微系统

Transmitted-light differential interference contrast microscopy system for measuring transparent surface topographies

干涉显微镜中相移误差分析

Analysis of phase - stepping error in differential interference microscopy

相移误差是影响干涉显微镜测量表面形貌精度的主要因素之一。

Phase stepping error causes measuring errors in differential interference contrast microscopy .

透射式微分干涉显微镜测量光纤折射率分布

Measurement of refractive index profile of optical fiber by a transmitted-light DIC microscope

干涉显微镜测量表面粗糙度条纹的自动处理

Automatic processing of interferogram from surface roughness measuring interferometer

相差显微镜与干涉显微镜的比较

Comparison between phase contrast and interference microscopes

光纤折射率剖面的测量（干涉显微镜法和近区场法）

Measurement of the Refractive Index Profile of Optical Fibers ( Interference Microscope Method and Near Field Method )

利用干涉显微镜首次测得了板条马氏体形状应变的大小及方向。

The magnitude and direction of lath martensitic shape strain is firstly measured by a new interference method in this research .

采用微分干涉显微镜直接测量表面轮廓的差分，从而无需使用标准参考反射镜，并能有效地抑制机械振动等环境干扰对测量结果的影响。

The technique , by using of a differential interference microscope , is insensitive to vibration and no reference surface is needed .

对两种测量光纤折射半剖面的方法：干涉显微镜法和近区场法，进行了评价。

Two methods of measurement of the refractive index profile in optical fibers : interference microscope method and near field method are evaluated .

通过相差显微镜、微分干涉显微镜、HE染色、透射电镜、扫描电镜观察培养细胞的形态学特征。

The phase-control and differential interference microscopes , HE staining , TEM and SEM were used to observe the morphology of the cultured cells .

同时给出了该方法原理性实验的观察结果，并与微分干涉显微镜的观察结果进行了对比。

In addition , the observed result of the theoretical experiment , and a comparison to the result from a differential interference microscope is also provided .

本文介绍了国外研究的一种新型近场扫描无孔径干涉显微镜的原理及结构。

The principles and schemes of a new type of scanning near field optical microscope , scanning interferometric apertureless microscope developed abroad are described in this paper .

摘要采用原子力显微镜、干涉显微镜对水热法合成蓝宝石和天然绿柱石等宝石的表面微形貌进行了研究。

Surface microtopography , representation and tracer of microscale vortex dislocation of hydrothermal synthetic sapphires and natural beryls are studied by using atomic force micro-scope and interference microscope .

利用干涉显微镜和原子力显微镜观察研究了Ti8%Cr（质量分数）合金中析出的片状相的表面浮突。

Surface relief effect associated with plate like precipitates in Ti 8 % Cr alloy was investigated by atom force microscopy ( AFM ) and optical interference micrograph .

双焦点干涉显微镜因其高稳定性和高分辨率的特点而受到重视，其核心元件双折射透镜由一片双折射晶体和一片光学玻璃胶合而成。

The birefringent lens , consisting of a piece of birefringent crystal and a piece of optical glass , is a key component in the dual focus interference microscope .

通过微分干涉显微镜和HE染色观察细胞形态学改变，免疫组化染色检测细胞角蛋白和波形蛋白表达情况；

The morphological changes of the cells were observed with differential interference contrast microscope and HE staining . The expression of cytokeratin and vimentin was identified with immunohistochemical staining .

在相移干涉显微镜中增加了自动调焦系统，使其快速获取高清晰干涉图像，提高了三维形貌的测量速度和测量精度。

The measuring speed and measuring accuracy are improved through adding an automatic focusing system to the phase-shifting interference microscope , by which interference images with high definition are quickly obtained .

采用荧光显微镜、微分干涉显微镜和电子显微镜技术，系统研究了非亲和组合中小麦对条锈病低反应型抗性的组织学和超微结构特征。

The incompatible combinations between races of Puccinia striiformis and wheat cultivars with resistance of low reaction type was examined by means of fluorescent microscopy , differential interference contrast microscopy , and electron microscopy .

摘要采用干涉显微镜、环境扫描电子显微镜、原子力显微镜对海南三亚企鹅贝及其附壳珍珠的珍珠层表面微形貌进行了研究。

Surface microtopography , representation and tracing of nacreous layers of Pteria penguin and blister pearl from sanya , Hainan province , are studied by using interference microscope and environmental scanning electron microscope and atomic force microscope .

利用微分干涉显微镜等手段，对九龙绿柱石晶体进行了形貌研究，发现{0001}{、1121}和{1010}面上具有丰富的表面微形貌。

By means of differential interference microscopy , and so on , the authors studied the morphology of beryl crystals from jiulong county . Pinakoid , hexagonal prism and hexagonal bipyramid possess abundant surface microtopography among the surfaces of beryl crystals .

本文在考虑聚焦效应的情况下，从理论上探讨了用干涉显微镜法测多模梯度型光纤折射率分布的干涉条纹图计算方法。

This paper discusses the focusing effects in interferometric analysis of graded-index optical fibers , and deduces the relation between the interferogram and real refractive - index profile of the fibers by means of integrating the effective ray path over the thickness of the fiber sample slice .

样品在1050～1200℃范围进行氢退火，退火前后样品上的流水花样缺陷（FPD）和晶体原生粒子（COP）在腐蚀后分别用微分干涉光学显微镜和激光记数器进行观察。

After hydrogen annealing at the temperature range of 1050 ~ 1200 ℃ for 1 ~ 2h , the flow pattern defects ( FPD ) and crystal originated particles ( COP ) relative to voids are observed by optical microscope and laser particle counter respectively .