晶格常数

粉末X射线衍射结果表明随着x值的增大，固溶体AMT晶格常数线性增大、热稳定性越高。

The results indicate that with the augment of the x values the crystal lattice constants and thermal stability increased .

利用该程序，我们得到了基本半导体Si和Ge的平衡晶格常数和体模量。

Using the program we have obtained the equilibrium lattice constants and bulk moduli of elemental semiconductors Si and Ge .

合金的晶格常数随B含量的增加呈现上升趋势；

TRENDS The lattice parameter increases with B content increasing .

X射线衍射峰的位置向衍射角减小的方向移动，晶格常数和相对强度增大。

8 , the crystal lattice constant and relative intensity are increased .

利用XRD研究发现，晶格常数a基本保持不变，晶格常数c先减小后增大，这主要和样品中氧的非化学计量比和制备方法有关；

It was explained that these results were related to oxygen nonstoichiometry and preparation methods ;

计算掺Ag的La0.67Ca0.33MnO3多晶样品的晶格常数发现，随着掺Ag量的增加，晶格常数减小。

With the increase of Ag - doped , lattice parameters decrease .

与无超声波场的水解产物相比较，由于超声波的作用使水解产物粒子变得均匀而分散，产物的晶格常数c和平均晶粒度减小。

Compared with the product obtained without ultrasonic wave irradiation , the crystal structure and grain size of hydrolysis product have been changed .

可变晶格常数乙醇-二氧化硅胶质光子晶体中的Raman散射

Raman Scattering of ethanol solvent in a photonic crystal with a variational lattice constant

使用X射线衍射技术研究了掺铬铌酸锶钡晶体的晶格常数。

The unit cell parameter of Cr doped strontium barium niobate are studied by means of X ray diffraction technique .

随着Al含量的增加，涂层中的（Ti，Al）N相将减少，且其晶格常数将降低。

The raise of Al element would decrease the formation and the lattice constant of ( Ti , Al ) N.

Si晶格常数超高精度传递测量中的标准晶体及制备

Standard Crystal and it 's Preparation Used in Crystal to Crystal Transfer of Si Parameter with Super High Accuracy

经XRD分析证明所制备的样品为单相体系，用MarqX程序对XRD数据进行分析得到其晶格常数。

The analysis of the XRD data confirms that the perovskite compounds are in their single-phase state .

氢对Ti合金的Debye温度和晶格常数的影响

Effect of hydrogen on Debye temperature and lattice parameter of titanium alloy

通过粉末X射线衍射分析准确地确定了其结构和晶格常数随Sr掺杂量的变化。

Crystal structure and lattice parameters as a function of Sr-concentration x was precisely determined by power X-ray Rietveld analysis .

Cu团簇的晶格常数在包埋状态下发生了膨胀，膨胀率大约在16%左右。

The Cu cluster and medium CaF_2 are both polycrystalline structure , and the Cu cluster 's lattice constant expands about 16 % .

在异质结构生产过程中，由于Si、Ge晶格常数的差异，不可避免地要产生失配位错。

In the production of heterostructure , the misfit dislocations are produced because the lattice mismatch between Si and Ge .

随着Al含量的增加，除晶格常数改变外，发现伴有一个强度可观的新的衍射面。

As Al content increases , a new diffractional face , with considerable intensity , was observed in XRD data , aside from increasing crystal parameters .

Mn掺杂导致了ZnO晶格常数和光学带隙的增加，并且诱导了微结构的无序性。

Mn incorporation results in the increase of the lattice constant and band-gap energy of ZnO , and also induces microstructural disorder .

X射线衍射分析表明所有样品都是比较好的单相，它们的晶格常数随着Ti和Mn的含量发生系列变化。

X-ray diffraction measurements revealed that all samples are single-phase materials , their lattice parameters change systematically along Ti as well as Mn doping .

掺杂浓度对稀磁性半导体（Ga，Fe）As的晶格常数及磁性质的影响

The effect of concentration of impurity on lattice constants and magnetic configurations of diluted magnetic semiconductor ( Ga_ ( 1-x ) Fe_x ) As

通过XRD测试，验证了Dy：KYbW和Tb：KYbW晶体均属于单斜晶系，C2/c空间群，计算了两种晶体的晶格常数。

Tb : KYbW and Dy : KYbW belong to monoclinic system with space group C2 / c. The lattice parameters were calculated .

随着Mn掺杂量的增加，样品的晶格常数增大，样品的紫外发光峰先红移后蓝移。

And with increasing Mn content , the lattice constant of samples increases , and the UV emission firstly red-shifts and then blue-shifts .

时效对微晶Al-Si系合金α-Al相晶格常数的影响

The Effect of Ageing Treatment on the α - Al Lattice Parameter of RS Crystallite Al-Si Alloys

X射线衍射谱表明掺入铈离子使得ZnO的晶格常数变大，衍射峰向小角方向移动。

It is showed that ZnO dopes cerium ions make the lattice constant larger in X-ray diffraction spectra . The diffraction peaks move to small angle .

试验结果表明：约束弧等离子体法制备的铝纳米粉晶体结构为fcc结构的晶态，与体材料相比晶格常数发生膨胀。

The experiment results indicate that the crystal structure of the samples is fcc structure , the lattice parameters are expanded .

Pd和Pt具有相似的晶格常数和电子性质，且地壳储量较Pt丰富，同时Pd在酸性介质下对甲醇氧化呈非活性。

Pd has similar lattice constant and electronic properties with Pt , being more abundant than Pt and inactive toward methanol oxidation under acid medium .

高分辨力x射线衍射仪是半导体外延层结构分析的有力工具，利用它可以确定外延层的晶格常数、应变结构、组份和应力等。

High-resolution x-ray diffractometer is a powerful analysis tool on semiconductor epitaxial layer . Using it people can measure crystal parameter , strain , composition and stress of epitaxial layer .

掺杂YIG单晶普适晶格常数经验公式

An Universal Experienced Formula for Calculating Lattice Constants of Substituted YIG Single Crystal

XRD结果表明：合成产物具有尖晶石结构，随掺铬量的增加，样品的晶格常数变小，晶胞体积收缩。

The XRD results showed that all the samples had a spinel structure and the lattice parameters decreased with the increasing amount of the chromium - doped .

采用高分辨X射线高强衍射模式，以衬底衍射峰为参考，探讨了测量外延膜准确晶格常数的方法。

The measuring method of the accurate crystal constants was discussed basing on the substrate peak of the X-ray high intensity diffraction spectrum and the errors induced by misorientation must be deducted .