场离子显微镜

场离子显微镜原子探针在材料科学中的应用

The application of field ion microscope atom probe for Materials Science

场离子显微镜及钨晶体表面结构观察

The field ion microscope and the observation of surface structure of tungsten crystal

Fe3Al合金B2有序化过程的场离子显微镜观察

FIM observation on B2 ordering in fe_3al alloy

本文利用场离子显微镜－原子探针（FIM－AP）及电镜研究了具有巨磁电阻效应（GMR）的甩带Cu88Co12合金的微结构。

The microstructure of melt spun Cu 88 Co 12 alloy was studied utilizing transmisson electron microscope ( TEM ) and field ion microscope with atom probe ( FIM AP ) .

场离子显微镜（二）&FIM在表面物理研究中的贡献

Field ionmicroscopy (ⅱ) & contribution of FIM to the surface physics

场离子显微镜观测单壁碳纳米管

Field-ion Microscope Study of Single-walled Carbon Nanotube

场离子显微镜模式，可以研究表面原子结构，提供具有原子分辨的实空间原子排列信息；

Field Ion Microscope mode , in which information of surface atom structure is obtained ;

场离子显微镜原子探针系统校正

The Calibration of the Atom Probe System

含晶界场离子显微镜&原子探针试样的制备技术

Technique on Preparing Test Samples for the Use of Field Ion Microscope Atomprobe Containing Crystal Boundary

场离子显微镜和飞行时间原子探针及其在定量研究固体表面原子微观过程中的应用（一）

Field Ion Microscope and Time-of-Flight Atom Probe and Their Applications to Quantitative Atom Microexamination on Solid Surface ( I )

场离子-扫描隧道显微镜

Field ion & scanning tunneling microscope

为寻找高强度的相干电子源，我们自主研制了一台集低能电子点源显微镜和场发射/场离子显微镜于一体的设备。

In search for a high-intensity coherent electron source , a facility has been developed that can function as a LEEPS microscope or a field-emission / field ion microscope ( FEM / FIM ) .