二仪

应用圆二色仪初步测定了重组蛋白的二级结构，重组SD的二级结构中大约有29.2%的α螺旋，9.3%β折叠，32.7%β转角，28.8%无规卷曲。

Circular dichroism studies on the recombinant SD indicated that the secondary structure of the recombinant protein had about 29.2 % α - Helix , 9.3 % β - Sheet , 32.7 % β - Turn , 28.8 % Random coil .

傅立叶变换红外光谱法测定黄姜中皂素含量其中包括傅立叶变换拉曼色谱仪，红外二色仪，红外显微镜和核磁共振成象光谱仪。

Determination of Saponin in D.Zingiberensis Wright by Fourier Transform Infrared Spectrometry Among these are the introduction of FT Raman , IR dichroism , IR microscopy , and NMR imaging spectrometers .

傅里叶光谱仪扫描速度对测试的影响其中包括傅立叶变换拉曼色谱仪，红外二色仪，红外显微镜和核磁共振成象光谱仪。

Effects of Scan Rate of the Fourier Transformation Spectroscopy on Test Result Among these are the introduction of FT Raman , IR dichroism , IR microscopy , and NMR imaging spectrometers .

四氯化碳和苯分子的高压原位拉曼光谱和费米共振研究其中包括傅立叶变换拉曼色谱仪，红外二色仪，红外显微镜和核磁共振成象光谱仪。

Raman Study of Phase Transitions and Fermi Resonance on CCl_4 and C_6H_6 under High Pressure Among these are the introduction of FT Raman , IR dichroism , IR microscopy , and NMR imaging spectrometers .

红外焦平面阵列（IRFPA）技术是发展二代热像仪的关键。

Infrared Focal Plane Array ( IRFPA ) is the key technology in developing second generation Infrared Thermal Imager .

为探明病毒侵染对烟草细胞膜的损伤作用，采用圆二色波谱仪（CD）分析了被TMV侵染的烟草细胞膜蛋白结构的变化，以及右旋紫草素对感病烟草细胞膜的作用。

The changes of secondary conformations of tobacco cell membrane protein after TMV-infection was investigated by CD Spectra Technique and the changes in membrane molecular conformations was checked .

它用一块PIO并行接口电路控制12位A/D转换电路及多路转换器，以实现二台测量仪的数据采集。用另一块PIO并行接口控制CASIOHR10型计算器打印机。

The system makes use of one PIO parallel interface output circuit to control a 12-Bit Successive Approximation Integrated A / D circuit and multiplexer so as to read data of two measuring instruments and uses another PIO to control CASIO-MR-10 type calculator-printer .

应用二轴流速仪定向原理估计船舶遭遇的浪向

Estimation of Ship Encountering Wave Direction with the Oriented Principle of Two Axis Current Meter

北仑电厂二期工程仪控系统的设计选型

Design and Type selection of I & C for Beilun Power Plant 's Phase 2 Project

吸收三氧化二铝夹杂仪的研制及应用掺铈铝酸钇闪烁晶体自吸收问题研究

Study and application of absorbing alundum inclusion meter Investigation on the Self-Absorption of Ce : YAP Crystals

这二种水平仪都能够既进行水平测定，又测量一定倾斜角度。

These two kinds of the horizontal determination tools can both carry on the level determination and survey a certain angle of tilt .

在第二代丰度仪中由于大大加强了计算机技术的应用，才有可能使无源γ射线能谱法在线检查元件丰度的方法充分发挥了它的潜力。

The method of online inspection of rods enrichment with passive gamma-ray can play its role fully due to the application of computer in the second generation of nondestructive testing device .

利用霍耳测试仪、X射线双晶衍射仪、二次离子质谱仪，对隧道结的重掺杂和互扩散特性进行了研究。

The characteristic of heavy doping level of tunnel junction and diffusion each other is investigated by means of Hall technique , X ray diffraction technique and SIMS .

利用二次离子质谱仪检测了铝箔表面区Fe、Si、Cu、Mg、Mn、Zn等微量元素的分布。

The distribution of trace elements as Fe , Si , Cu , Mg , Mn and Zn in the surface layer was also determined by secondary ion mass spectrometer .

采用了二次离子质谱仪（SIMS）和俄歇电子谱仪（AES）进行表面分析。

The experiments were performed by means of Secondary Ion Mass Spectroscopy ( SIMS ) and Auger Electron Spectroscopy ( AES ) .

动态型二次离子质谱仪（SIMS）是进行微粒同位素分析最适用的测量仪器之一。

The Secondary Ion Mass Spectrometer ( SIMS ), especially dynamic SIMS , is the most suitable instrument for particle isotopic analysis .

杂质Ga及载流子浓度在Si02-Si界面附近的动态分布分别采用二次离子质谱仪（SIMS）和扩展电阻（SRP）进行测量。

Impurity Ga and the carrier concentration distribution are measured by SIMS and spreading resistance profile ( SRP ) spectroscopy individually .

运用二次离子质谱仪测量了样品中Mn的深度分布，发现退火温度对样品中Mn的分布有很大影响。

The distributions of Mn in annealed samples were measured by Secondary Ion Mass Spectrometry ( SIMS ), it is showed that the temperature of annealing has great affection on the distribution of Mn in sample .

本文对功率晶体管（GTR）正偏二次击穿测试仪的研制进行了说明，并给出了主要技术参数。

The development of the test instrument for forward-biased second breakdown for characteristics of power transistors ( GIR ) is described and main parameters are given .

使用时间飞行二次离子质谱仪（TOF-SIMS）、X射线光电子能谱仪（XPS）、原子力显微镜（AFM）和接触角测量仪对FTE自组装膜进行了表征。

A time-of-flight secondary ion mass spectrometer ( TOF-SIMS ), X-ray photoelectron spectroscopy ( XPS ), an atomic force microscopy ( AFM ), and contact angle measurements were used to characterize the monolayer .

应用时间飞行二次离子质谱仪（TOF-SIMS）、原子力显微镜（AFM）和接触角测量仪对FTE自组装膜进行表征。通过Olympus磁头磁盘界面可靠性测试系统对FTE自组装膜的摩擦学性能进行研究。

The FTE SAMs was characterized by the time-of-flight secondary ion mass spectrometer ( TOF-SIMS ), atomic force microscopy ( AFM ) and contact angle measurement , and the tribology properties of the FTE SAMs were measured by the Olympus head / disk interface reliability measurement system .

介绍一种智能型互感器/PT二次压降测试仪

Introduction to A Intelligence Transformer / PT Secondary Drop Test Instrument

核保障的微粒分析与二次离子质谱仪

Particle Analysis in Nuclear Safeguards and Secondary Ion Mass Spectrometer

带误差补偿的二位置寻北仪设计

Design of Two-Position Gyro-Based North Seeker with Error Compensation

二次离子质谱仪的原理及在半导体产业中的应用

The Principle and Application in Semiconductor of SIMS

应用飞行时间二次离子质谱仪分析煤的微观结构

Analysis of Coal Macerals by TOF - SIMS

第二代轨道检查仪数据处理技术的研究

Study on Data Processing of Second Generation Inspecting Instrument for Static Geometry Parameter of Track

真空紫外圆二色性测量仪二维圆柱形隐身衣的电磁色散特性研究

Vacuum ultraviolet circular dichroism instrument Research on Electromagnetic Dispersion Characteristics of Two-dimensional Cylindrical Invisibility Cloaking

力作用点变化时使用加长八角环的二向测力仪的输出的计算

The Calculation of Strain output of Two Dimensional Dynamometer Using Elongated Octagonal Rings When Changing the Force Effect Point

第二个处理干涉仪的功能是重建干涉效应，恢复辐射分量的时间相干性。

It is the function of the second processing interferometer to re-establish interference effects by bring components of the radiation back into temporal coherence .