磁力显微镜

纳微米尺度单基质白光荧光体的微结构和光谱调控研究本文利用磁力显微镜研究纳米尺度磁畴的检测方法。

Tuning Microstructure and Luminescence of Nano - / microsized Single Host Phosphors for White Light ; MFM is an effective method to study magnetic domains and research magnetic materials .

介绍了磁力显微镜（MagneticForceMicroscopy，MFM）的原理、操作以及用于Nd-Fe-B合金磁畴观察的研究状况。

As an advantage technique , magnetic force microscopy ( MFM ) was introduced for the observation of magnetic domains , including its principles and applications in Nd Fe B permanent magnets .

借助磁力显微镜的抬高模式测量氧化皮的磁畴图，获得了氧化皮内Fe3O4的分布形态及冷却速率对其变化的影响.结果表明：快速冷却时氧化皮中Fe2O3的含量减少；

Ssbauer spectroscopy . The distribution of Fe_3O_4 in the oxide scale was obtained using Magnetic Force Microscope ( MFM ), through which the influence of the cooling rate on the distribution of Fe_3O_4 was stud - ied .

磁力显微镜（MFM）作为研究表面磁结构的有力工具广泛地应用于磁性薄膜的研究中。

Magnetic force microscopy ( MFM ) is an important powerful technique in the research of the surface domains . MFM has been widely used to study the soft magnetic sample .

磁力显微镜（MFM）的分辨率高达20～50nm，是纳米尺度磁性材料表面磁结构研究新的有力的工具。

With the lateral resolution of 20 ~ 50nm , magnetic force microscope ( MFM ) has become a new powerful tool in the study of surface magnetic structures of magnetic materials on nanometer scale .

磁力显微镜的发展历史、原理和应用

History and principles of magnetic force microscope and Its Applications

磁性石榴石薄膜的磁力显微镜研究

Studies of Magnetic Garnet using Magnetic Force Microscope

纳米磁性材料的磁力显微镜研究及自旋注入有机半导体探索

Magnetic Force Microscopy Study of Magnetic Nano-Materials and Exploration of Spin Injection into Organic Semiconductors

磁力显微镜的新应用；

New application of magnetic force microscope ;

对于垂直各向异性的薄膜，磁力显微镜图直接给出了它的磁畴结构图，杂散场垂直于膜面的分量给出了它的磁畴和畴壁位置。

For a perpendicular anisotropic thin film , magnetic force microscopy directly gives its domain structure diagram . The component perpendicular to the film plane gives the position of the domain and the domain wall .

利用原子力显微镜和磁力显微镜对样品的表面进行分析，发现退火条件会影响样品磁性粒子的分布。

Through the sample surface analysis by Atomic Force Microscope ( AFM ) and Magnetic Force Microscope ( MFM ), it is showed that the condition of annealing will effect the distribution of the grain in sample .