电子显微术

Cu-Zn-Al合金的X射线和电子显微术的研究

X-ray diffraction and electron microscopy of Cu-Zn-Al alloys

我们已经通过可见紫外光谱、透射电子显微术、X射线衍射和电气化学测量法对金纳米花的特性进行了分析。

The GNFs have been characterized by UV-visible spectroscopy , transmission electron microscopy ( TEM ), X-ray diffraction ( XRD ), and electrochemical measurements .

Al（20）Cu2Mn3相中孪晶的高分辨电子显微术研究

High resolution study of twins in al_ ( 20 ) cu_2mn_3 phase

Z衬度扫描透射电子显微术的前沿进展

Z-contrast scanning transmission electron microscopy in materials science

Zr（Cr，V）2Laves相长周期堆垛结构的高分辨电子显微术观察

HREM observation on long-period stacking structure of zr ( cr , v ) _2 Laves phase

用高分辨电子显微术直接鉴定ZnS多型体中堆垛序列和缺陷

The direct determination of stacking faults sequence in ZnS polytype by high resolution electron microscopy

运用透射电子显微术（TEM）对由分子束外延（MBE）制备的GaAsInGaAs多层量子点样品进行观察和分析。

GaAs / InGaAs quantum dots grown by molecular beam epitaxy ( MBE ) were studied .

本文介绍扫描电子显微术（SEM）和扫描探针显微术（SPM）这两种最常用的微分析方法的新进展。

Recent developments of scanning electron microscopy ( SEM ) and scanning probe microscopy ( SPM ) were reviewed as commonly used microanalysis methods .

用X射线衍射分析（XRD）、扫描电子显微术（SEM）和傅立叶变换红外光谱分析（FTIR）综合表征了产品的形貌及结构情况。

The product 's characterization was carried out by X ray diffraction ( XRD ), scanning electron microscopy ( SEM ) and fourier transfer infred spectrometer ( FTIR ) .

用透射电子显微术对Ni-Cr基自溶合金喷熔层进行了微观研究。

The microstructural study was carried out on the Ni-Cr base self-fluxing alloy thermal spraying coats by TEM .

本文成功地利用透射电子显微术探讨了高温高压条件下于FeNiC系统中生长的人造金刚石单晶内部的微观杂质。

Transmission electron microscopy ( TEM ) has been successfully used to in investigate micro inclusions trapped in synthetic diamond single crystal grown from Fe Ni C system under high temperature and high pressure .

用透射电子显微术和X射线能谱术研究了Ti3Al-11Nb（Ti-12.5wt%Al-21wt%Nb）合金热锻棒材在热处理过程中的相变特征。

The phase transformation of the Ti_3Al-11Nb ( Ti-12.5wt % Al-21wt % Nb ) alloy has been investigated by TEM and EDS. The hot forged rods of the alloy were used in the experiment .

Al-Cu-Mg合金中S′相生长微观机制的高分辨电子显微术研究

High-resolution electron microscopy on the microstructural growing mechanism of s ' phase in Al-Cu-Mg alloy

采用电子显微术和颗粒数密度（Nv）计量法。

METHODS The electron microscopy and morphometry of granule numerical density ( Nv ) was used in the study .

本文综述了反射电子显微术（REM）和反射电子能量损失谱（REELS）在表面科学中的应用。

A review is given on the applications of high-energy reflection electron microscopy ( REM ) and reflection electron energy-loss spectro-scopy ( REELS ) in surface sciences .

高分辨电子显微术（HREM）及电子衍射图（EDP）分析表明，在这种材料中存在三种相，分别用A、B、C来表示。

High resolution electron microscopy ( HKEM ) and electron diffraction pattern ( EDP ) indicated that there are three phases in the material which can be represented by Phase A , B and C , respectively .

采用高分辨电子显微术，获得了BeAl2O4∶Cr~（3+）晶体的晶格象，观察研究了晶体中的结构缺陷。

The structure defects in BeAl_2O_4 ∶ Cr ~ ( 3 + ) laser crystals were Investigated and the lattice images were obtained by high resolution electron microscopy .

国内外许多研究小组利用透射电子显微术和X射线衍射对GaN薄膜位错的研究集中在用不同的测试方法对位错密度的分析，但通过这些方法表征的位错密度与器件发光性能存在矛盾。

Many studies have been done on different approaches studied the density of threading dislocations of GaN , such as Transmission electron microscopy ( TEM ), X-ray diffraction ( XRD ), but the results which measured by these approaches are not consistency with luminescence .

Nd-Ba-Cu-O高温超导体的高分辨电子显微术研究

High resolution electron microscopy study on high t_c superconductor nd-ba-cu-o

在低温下，用弹道电子显微术（BEEM）及其谱线（BEES）测量了CoSi2/Si接触的局域肖特基势垒高度。

The local barrier heights of the CoSi 2 / Si contacts are determined by using the ballistic electron emission microscopy ( BEEM ) and its spectroscopy ( BEES ) at low temperature .

利用X射线衍射（XRD）、高分辨透射电子显微术（HRTEM）和X射线能谱（EDS）研究了共溅射Cu-Ta薄膜中非晶相的形成。

Formation of amorphous phase in binary immiscible Cu-Ta thin films prepared by co-sputtering method has been investigated using X-ray diffraction ( XRD ), high-resolution transmission electron microscopy ( HRTEM ) and electron dispersive X-ray spectroscopy ( EDS ) .

本文利用透射电子显微术（TEM）研究了Ti3Al基合金轴向疲劳试样的变形组织，重点分析了初生α2晶粒的变形协调机制。

He microstructure of Ti_3Al-base alloy in an axial fatigue condition has been observed by transmission electron microscope ( TEM ), and the coordinated mechanism of deformation of primary α _2 phase grains has been emphatically studied .

经X射线衍射仪、透射电子显微术和示差扫描量热仪（DSC）热分析研究表明，随着合金中Cu含量的增加，Al-Ni-La-Cu的非晶形成能力逐渐增强，晶化温度逐渐降低。

The alloy was studied with X ray diffraction , transmission electron microscopy and differential scanning calorimetry . As a result , with the amount of copper increasing , the glass forming ability of Al Ni La Cu alloy is gradually increased , but the crystalline temperature is gradually decreased .

采用透射电子显微术，研究了GH169高温合金孔挤压强化层的微观结构。

By TEM analysis , the microstructure of the hole expansion strengthened layer of high temperature alloy GH169 was studied .

用热化学气相合成法制备的超细SiC粉末的组织结构，保留了许多与形核生长过程直接有关的许多特点，为用高分辨电子显微术研究其形核生长过程提供了有利条件。

The structure of SiC ultrafine powder synthesised by the thermal chemical vapor-phase reaction method remains a lot of characteristics associated directly with the nucleation and crystal growth . It is favorable for the high resolution electron microscopy ( HREM ) study of the process of nucleation and crystal growth .

用倾斜束照明的电子显微术在分辨率为3.12A的水平上摄照了点阵象，直接观察了ZnS多型体的堆垛次序，这方法被用于揭示ZnS堆垛的无序和层错。

Lattice imaging with tilted illumination at the 3.12 A level has been used for direct determination of stacking sequences in ZnS polytype by observing electron micrographs . The method employed is used to reveal the stacking sequences in the disordered and faulted ZnS .

研究采用了含有添加剂的乙醇溶液作为镀液，沉积的银采用场发射扫描电子显微术（FESEM）和原子力显微术（AFM）加以表征。

In this study , ethanol was used as the plating solution in which some chemicals were added . The silver deposits were characterized by a field emission scanning electron microscopy ( FESEM ) and an atom force microscope ( AFM ) .

本文首次报道用电子显微术观察兔肌甘油醛-3-磷酸脱氢酶（GAPDH）晶体及游离酶分子的结果，并进行了光学衍射分析和光学滤波处理。

This paper shows the results of electron microscopic examination of the crystals and free molecules of glyceraldehyde-3-phosphate dehydrogenase ( GAPDH ) from rabbit muscle . The electron micrographs were analysed by optical diffraction and treated by optical filtering .

用剖面的电子显微术（XTEM）研究了后注Ar~+对高能注P~+硅中二次缺陷的影响。

By using cross-sectional transmission electron microscopy ( XTEM ) the effect of post-implanted Ar ~ + on the secondary defects in high energy P ~ + - implanted silicon are investigated .

用反射电子显微术对金刚石表面的研究

A study of synthetic diamond surface using reflection electron microscopy