扫描探针显微镜

基于数据库的扫描探针显微镜通用WIN95软件

A General WIN 95 Software for SPM Based on DataBase

本文将介绍扫描探针显微镜及其在微电子工艺和器件微分析中的应用。

This paper gives an overview of SPM technology and its applications in microanalysis of microelectronics process and devices .

基于Linux的单机全数字控制的扫描探针显微镜

Scanning probe microscope controlled by single personal computer with Linux

基于DSP的扫描探针显微镜的研究与应用

Research and Application of SPM Based on DSP

数字扫描探针显微镜中的DSP技术

DSP technology in scanning probe microscope

利用扫描探针显微镜、扫描电子显微镜和X射线衍射等技术对制备的金胶体进行表征。

Au nanoparticles were characterized by means of scan electron microscope ( SEM ), scan probe microscope ( SPM ) and X-ray diffraction ( XRD ) .

用扫描探针显微镜AFM功能能观察到白酒的微观颗粒状态。

The AFM function of scanning probe microscope can observe the microscopic particles state of white liquor .

把模拟探针的运动实时转化成了SPM指令驱动远程扫描探针显微镜进行真实的纳米操纵。

Translate the operations of simulative probe into AFM instructions to drive remote SPM .

用X射线衍射仪、振动样品磁强计和扫描探针显微镜系统分析了上述样品的微结构和磁特性。

The microstructure and magnetic properties were measured by X-ray diffraction ( XRD ), scanning probe microscope ( SPM ) and vibrating sample magnetometer ( VSM ) .

扫描探针显微镜（SPM）当前的发展趋势是功能复合化和数字化。

A general trend of Scanning Probe Microscope ( SPM ) is to multiple functionality and digitalization .

扫描探针显微镜（SPM）在精密尺寸计量中的应用

Precision Dimensional Measurement with SPM

Bi4Ti3O（12）的水热合成及扫描探针显微镜电学性能研究

Study on the Synthesis of Bi_4Ti_3O_ ( 12 ) and Electrical Properties Test via Scanning Probe Microscopy

深亚微米ULSI工艺检测技术&扫描探针显微镜

Deep sub-micron ULSI process measurement : Scanning probe microscope technology

探讨了外界激振对扫描探针显微镜（SPM）扫描图像的影响。

The influence of external vibration on scanned images of scanning probe microscope ( SPM ) is discussed .

研究了用于扫描探针显微镜，特别是原子力显微镜（AFM）中的扫描器高精度定位问题。

The high-precision positioning with scanners in Scanning Probe Microscopes applications , particularly in atomic force microscopes ( AFM ), was studied .

用扫描探针显微镜（SPM）技术观察三维表面形态，可以达到纳米级甚至原子量级的分辨率，所以SPM技术在计量方面有着广阔的应用前景。

SPM techniques show great potential in metrology because three-dimensional topographic features with nanometer even atomic resolution can be achieved .

扫描探针显微镜（ScanningProbeMicroscope，SPM）是近几年发展很快的一种形貌表征仪器。它的一个突出优点是，可在溶液中以很高的分辨率对细胞活体进行观察。

One of the outstanding advantages of scanning probe microscope ( SPM ), is that SPM tip can be scanned in liquid environment , and used to scan living cell with very high resolution .

扫描探针显微镜（SPM）是研究纳米科技的重要工具。

In the field of nano-technology , One of the most important tools used for observation and research is Scanning Probe Microscopy ( SPM ) .

选用典型的二氧化钛纳米超亲水薄膜，用扫描探针显微镜（SPM）和电化学测试系统进行一般性的表征。

A typical nanostructured titania super hydrophilic film was chosen for general characterization employing a Scanning Probe Microscope ( SPM ) and an electrochemical measurement system .

应用X射线衍射仪（X-Raydiffraction）、振动样品磁强计（VibratingSampleMagnetometer）和扫描探针显微镜（ScanningProbeMicroscope）测量了薄膜样品的微结构、磁特性和表面形貌与磁畴结构。

The microstructures were examined by X-ray diffraction ( XRD ) . Magnetic properties were measured by vibrating sample magnetometer ( VSM ) . And the morphologies and domain structures were observed by scanning probe microscope ( SPM ) .

扫描探针显微镜（SPM）现在不仅用于表面微观形貌的检测，同时也用于纳米超精密加工和原子操纵。

Scanning probe microscope ( SPM ) is used not only for measuring the micro profiles of surfaces , but also for nano ultraprecise machining and atom manipulation now .

本文简要评述了扫描探针显微镜（SPM）技术的提出、发展及其在自组装体系中的研究应用。

In this dissertation , the invention and development of scanning probe microscopy ( SPM ) and its application in Self-assembled Monolayers ( SAMs ) systems have been reviewed .

提高作为纳米科技的眼和手的扫描探针显微镜（SPM）的测量和定位精度，是纳米仪器界始终追求的目标。

It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope ( SPM ), the eye and hand of nanometer science and technology .

对扫描探针显微镜（SPM）仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。

Several quantitative drift measurement techniques for scanning probe microscopy ( SPM ) were introduced . A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift .

为分析外界振动对扫描探针显微镜（SPM）针尖-样品副的影响，提出抑振系数的概念。

To analyze the influence of external vibration on the tip-sample interaction of scanning probe microscope ( SPM ), a concept , vibration rejection ratio ( VRR ), was proposed .

在扫描探针显微镜（SPM）的扫描过程中，由SPM的扫描线与物质表面周期性晶格结构进行干涉可以形成纳米云纹图像。

Moir é technique using a scanning probe microscope ( SPM ) is developed , in which the natural periodic structure of a crystal is used as an ideal spacing grating .

SPM通用平台是一套扫描探针显微镜开发工具系统，它提供了一种开发生产SPM新的思路和方法，使SPM成为通用、开放、兼容的仪器体系。

The research of scanning probe microscope ( SPM ) commonly used platform provides a new idea and method for developing SPM instrument , makes SPM instrument more common , open and combinative .

利用扫描探针显微镜（SPM）进行电场诱导氧化加工的方法可应用于半导体微型器件和纳米电子器件的加工制作。

The process of field-induced oxidation using scanning tunneling microscope ( STM ) / atomic force microscope ( AFM ) can be applied to the fabrication of semiconductor micro devices and nano-electric devices .

扫描探针显微镜（SPM）是扫描隧道显微镜（STM）、原子力显微镜（AFM）、近场光学显微镜（SNOM）等近几年发展起来的新型显微镜的总称。

Scanning Probe Microscope ( SPM ) is a general term for Scanning Tunnel Microscope ( STM ), Atomic Force Microscope ( AFM ) and Scanning Near-Field Optical Microscope ( SNOM ) .

研究了交联单体种类及交联单体在共聚单体中的含量对聚合物膜的外观、力学性能、Tg和表面形貌的影响。用强力仪、DSC和扫描探针显微镜进行了表征。

The effect of cross-linking monomer type and content in copolymer monomer on the appearance , mechanical properties , Tg and surface morphologies of the prepared polymer films were studied by using strength tester , DSC and scanning probe microscope .