透明介质

利用线阵CCD测定透明介质折射率的实验研究

Experiments on Measurement of Refractive Index of Transparent Medium with CCD

利用线阵CCD测量透明介质折射率

Measuring index of refraction of transparent medium with linear CCD

光学层面分析（OpticalTomography）是重建透明介质某一层面参量场分布的诊断技术。

Optical tomography is the diagnose technology that reconstructs parameter field distri-bution of transparent medium layer .

用Lan效应快速测量透明介质折射率

The Quick Measurement of Refractive Index of Transparent Material by Lau Effect

透明介质中单缝Fraunhofer′s衍射条纹的变化

Variation in single slit Fraunhofer ′ s diffraction fringe in transparent medium

着重分析讨论了近年来PDP透明介质浆料所采用的几种基础玻璃系统的优缺点。

Especially , the advantages and disadvantages of several main basic glass systems used as the transparent dielectric pastes on PDP were discussed .

以光的等厚干涉原理为基础（1），用读数显微镜和砝码测量透明介质的杨氏模量，并用CCD显像技术提高了读环精度。

With the light interference principle of equal thickness as the foundation , we measure Yang 's mould amount of transparent medium . On the other hand , we improve the precision by using CCD technology .

透明介质下微结构表面形貌的Linnik显微干涉测量技术

Linnik Microscopic Interferometry for Measuring the Surface Profile of Microstructures Through Transparent Media

本文由两方面的内容组成：飞秒激光在透明介质中的三维光存储的研究和THz辐射脉冲的产生与探测的研究。

This thesis includes two parts : the study of three-dimensional optical storage inside transparent materials using femtosecond laser pulses and the study of generation and detection of THz radiation pulse .

介绍了等离子体显示器（PDP）封装用介质浆料的发展概况，综述了PDP对透明介质浆料的性能要求、介质浆料的组成及制备工艺。

The development of transparent dielectric pastes for sealing electrode of plasma display panel was introduced . And the required properties , composition and preparation technology of the pastes suitable for PDP were reviewed in this paper .

用半最大全宽度为10nsNd：YAG调Q倍频激光脉冲作激发源，研究了透明介质及吸收介质的简并的四波混频后向波的时间特性。

By using SH of a Q-switched Nd : YAG laser as the exciting pulse with FWHM of 10 ns , the time character of the backward waves were demonstrated for both transparent and absorbing media .

本文为测量金属膜的厚度提供了一种新的用双波长的测量方法，该方法测量简便、精度高，同时也适用于透明介质膜的厚度测量，测量范围从几十个波长至1cm。

A new method of measuring metal film thickness is presented in this paper . The method is simple to operate and has high accuracy . The thickness of a transparent medium film can also be measured by it .

透明介质特性的测量与方法研究

Measurement of characteristic of transparent medium and study of experiment method

用飞秒激光在透明介质体内形成衍射光栅

Fabrication of Internal Diffraction Gratings in Transparent Materials Using Femtosecond Laser

用掠入射法测量透明介质折射率的探讨

Discussion on surveying refractive index of transparent medium by glancing incidence

电磁感应透明介质中的弱光空间暗孤子环

Spatial weak-light ring dark solitons in an electromagnetically induced transparency medium

飞秒激光烧蚀透明介质的实验和理论研究

Experimental and theoretical study on the ablation of dielectrics by femtosecond lasers

透明介质的厚度与折射率的测量

Measurement of thickness and index of refraction of transparent medium

纳米厚度非透明介质薄膜的测量

Measuring and Calculating the Thickness of Non - transparent Dielectric Thin Film

用于检测透明介质中微粒的光奇异滤波器的研究

Study of optical novelty filter using into detection particle in transparent medium

近透明介质平板的热辐射特性

Thermal Radiation Properties of Plate Made of Approximate Transparent Medium

超短脉冲与透明介质相互作用研究

Studies on the Interaction of Ultra-short Laser with Transparent Medium

讨论了飞秒激光脉冲与透明介质的非线性相互作用。

The nonlinear interaction of fs laser and transparent materials is discussed .

基于透明介质和颗粒图像技术的土体变形测量研究进展

Research Progress in Soil Deformation Measurement Using Transparent Media and Particle Image Velocimetry

飞秒激光在透明介质中诱导光学微腔的实验研究

Experiment research on femtosecond-laser-induced optical micro-cavity in transparent materials

电磁感应透明介质中的慢光操控

Manipulation of Slow Light in Electromagnetically Induced Transparency Medium

透明介质厚度的散斑法测量

The measurement of the thickness of transparent medium with method of scattered - spot

也可用此方法检查透明介质中的微粒缺陷。

This method can be used to inspect particle flaw in the transparent medium .

超短脉冲激光对透明介质的烧蚀特性研究

Theoretical Study of Femtosecond Laser-Induced Ablation in Dielectrics

透明介质表面反射光和折射光的偏振态

The Polarization of Reflected Light and Refracted Light at the Surface of Isotropy Medium