二次离子质谱仪

利用霍耳测试仪、X射线双晶衍射仪、二次离子质谱仪，对隧道结的重掺杂和互扩散特性进行了研究。

The characteristic of heavy doping level of tunnel junction and diffusion each other is investigated by means of Hall technique , X ray diffraction technique and SIMS .

应用飞行时间二次离子质谱仪分析煤的微观结构

Analysis of Coal Macerals by TOF - SIMS

利用二次离子质谱仪检测了铝箔表面区Fe、Si、Cu、Mg、Mn、Zn等微量元素的分布。

The distribution of trace elements as Fe , Si , Cu , Mg , Mn and Zn in the surface layer was also determined by secondary ion mass spectrometer .

采用了二次离子质谱仪（SIMS）和俄歇电子谱仪（AES）进行表面分析。

The experiments were performed by means of Secondary Ion Mass Spectroscopy ( SIMS ) and Auger Electron Spectroscopy ( AES ) .

动态型二次离子质谱仪（SIMS）是进行微粒同位素分析最适用的测量仪器之一。

The Secondary Ion Mass Spectrometer ( SIMS ), especially dynamic SIMS , is the most suitable instrument for particle isotopic analysis .

杂质Ga及载流子浓度在Si02-Si界面附近的动态分布分别采用二次离子质谱仪（SIMS）和扩展电阻（SRP）进行测量。

Impurity Ga and the carrier concentration distribution are measured by SIMS and spreading resistance profile ( SRP ) spectroscopy individually .

运用二次离子质谱仪测量了样品中Mn的深度分布，发现退火温度对样品中Mn的分布有很大影响。

The distributions of Mn in annealed samples were measured by Secondary Ion Mass Spectrometry ( SIMS ), it is showed that the temperature of annealing has great affection on the distribution of Mn in sample .

使用时间飞行二次离子质谱仪（TOF-SIMS）、X射线光电子能谱仪（XPS）、原子力显微镜（AFM）和接触角测量仪对FTE自组装膜进行了表征。

A time-of-flight secondary ion mass spectrometer ( TOF-SIMS ), X-ray photoelectron spectroscopy ( XPS ), an atomic force microscopy ( AFM ), and contact angle measurements were used to characterize the monolayer .

应用时间飞行二次离子质谱仪（TOF-SIMS）、原子力显微镜（AFM）和接触角测量仪对FTE自组装膜进行表征。通过Olympus磁头磁盘界面可靠性测试系统对FTE自组装膜的摩擦学性能进行研究。

The FTE SAMs was characterized by the time-of-flight secondary ion mass spectrometer ( TOF-SIMS ), atomic force microscopy ( AFM ) and contact angle measurement , and the tribology properties of the FTE SAMs were measured by the Olympus head / disk interface reliability measurement system .

核保障的微粒分析与二次离子质谱仪

Particle Analysis in Nuclear Safeguards and Secondary Ion Mass Spectrometer

二次离子质谱仪的原理及在半导体产业中的应用

The Principle and Application in Semiconductor of SIMS