锌矿

难选氧化锌矿氨浸的动力学研究

Study on Kinetics of Ammonium Leaching of Refractory Oxide Zinc Ore

难选氧化锌矿浮选过程中脱泥作业的生产实践

Producted practice of desliming in the floatation of refractory oxidised zinc ore

薄膜均具有单相、c轴取向的六角纤锌矿结构。

All the films have the single-phase wurtzite structure with c-axis preferred orientation .

分析结果表明：不同掺杂浓度的样品都为纤锌矿结构，且其衍射峰都具有明显的c轴取向。

The results show that all the samples are wurtzite structural and have c-axis preferred growth orientation .

X射线衍射结果显示产物为ZnO纤锌矿结构。

XRD result indicates the crystal structures of ZnO wurtzite .

薄膜呈C轴择优取向的六角纤锌矿结构；具有致密平滑的表面形貌；

The results show that all samples have hexagonal wurtzite structure with c-axis preferred orientation and novel smooth compact morphology .

X射线衍射谱表明样品为六角纤锌矿结构的ZnO晶体。

X-ray diffraction spectra showed that the sample is hexagonal wurtzite ZnO structure .

在大气条件下，ZnO具有六方纤锌矿结构。

Usually ZnO has hexahedron wurtzite structure at the aircondition .

纤锌矿和岩盐结构ZnO的相变、弹性性质和电子结构研究

Phase Transition , Elastic Property and Electronic Structure of Wurtzite and Rocksalt ZnO

S掺杂纤锌矿ZnO晶体结构及电子性质的第一性原理研究

First-principles study of the crystal structures and electronic properties of S doped wurtzite ZnO

ZnO是一种具有纤锌矿晶体结构的直接宽带隙半导体材料。

ZnO is a wide direct-gap semiconductor with a hexagonal crystal structure of wurtzite .

结果表明：沉积电位对薄膜形貌有着显著的影响；多孔片晶ZnO为六方纤锌矿结构；

The results of XRD show that the thin film has a wurtzite structure .

XRD结果表明，ZnO粒子为六角晶系纤锌矿晶型。

The XRD results indicated that the ZnO nanoparticles were the hexagonal wurtzite crystallites .

XRD分析表明样品均为纯相纤锌矿结构的ZnO。

XRD analysis showed the formation of pure wurtzite crystalline phase of zinc oxide .

掺铝ZnO晶须晶体结构仍为六方纤锌矿结构，沿c轴择优取向。

Al-doped ZnO whiskers also have a crystalline structure of wurtzite-type , but grow slightly weak along the ZnO .

纤锌矿GaN光电性质的第一性原理研究

First-principle Study of Electronic and Optical Properties of Wurtzite Structure GaN

报告了X射线荧光光谱法在铜矿、铅矿、锌矿、钨矿和钼矿标准物质定值分析中的应用。

X-ray fluorescence spectrometry was applied to analysis of reference copper , lead , zinc , tungsten and molybdenum ores .

XRD分析显示纳米ZnO薄膜纯度高，呈纤锌矿结构。

XRD analysis demonstrates that the nanocrystalline ZnO thin film has phase purity and wurtzite structure .

纤锌矿GaN低场电子迁移率解析模型

An Analytic Low Field Electron Mobility Model of Wurtzite GaN

X射线衍射结果表明，ZnO∶Eu3+具有六角纤锌矿晶体结构。

The XRD pattern indicates that nanocrystalline ZnO ∶ Eu3 + has a hexagonal wurtzite structure and is polycrystalline .

XRD表征说明，ZnO纳米棒为纤锌矿结构，沿C轴取向性生长。

XRD pattern indicates that ZnO nanorods have a typical wurtzite structure and grow along with the c-axis direction well .

结果表明，实验制备的柔性AZO薄膜为六角纤锌矿结构，且具有良好的c轴择优取向。

Results show that the AZO thin films have polycrystalline hexagonal wurtzite structure with highly c-axis preferred orientation .

研究发现，该方法可以在玻璃衬底上成功制备具有纤锌矿结构的ZnO薄膜。

It was found that ZnO thin films of the wurtzite structure were prepared by this method .

纤锌矿GaN载流子输运的蒙特卡罗模拟

Carrier Transport in Wurtzite GaN Using Monte Carlo Method

结果表明：ZAO薄膜的结构为标准的ZnO纤锌矿相，没有Al2O3相出现；

The results show that it has a polycrystalline hexagonal wurtzite structure .

对薄膜的XRD分析表明，ZnO薄膜为六方纤锌矿结构并沿c轴取向生长，且（002）衍射峰的半高峰宽仅为0.24°。

As analyzed by XRD , the as-grown ZnO film shows a hexagonal wurtzite structure with a c-axis preferential orientation growth .

结果表明，样品组成为六方相纤锌矿结构ZnO，由结构疏散、分散性较好、团聚较小的小颗粒组成。

The results indicated that the sample with dispersed structure and good dispersion was wurtzite structure ZnO nanoparticle .

采用有效的手段对样品的质量表征：X-射线衍射（XRD）结果表明，纳米ZnO薄膜具有六角纤锌矿多晶结构。

X-ray diffraction ( XRD ) indicates the nanocrystalline ZnO thin films with a polycrystalline hexagonal wurtzite structure .

无电场时制得的ZnO纳米棒属纤锌矿结构，而在电场下制得的主要是红锌矿结构。

The nanorods have wurtzite structure without electrical field assistance and are primarily of zincite structure under electrical field .

使用锑磷共掺杂方法可以在GaN晶格中引入锑杂质，生成的GaN纳米线仍为结晶质量良好六方纤锌矿结构。

The crystal structure of Sb / P co-doped GaN nanowires remains wurtzite-type hexagonal structure .