电子衍射

用超快电子衍射技术研究Al薄膜的超快动力学行为

Ultrafast dynamics of thin-film aluminum observed by ultrafast electron diffraction

近α-Ti合金Ti3Si相电子衍射分析

Electron diffraction analysis of ti_3 Si-Phase in near α - ti alloy

不同晶相草酸钙晶体的选区电子衍射和X射线衍射比较分析

Comparative Analysis on Various Calcium Oxalate Hydrates by SAED and XRD

Si（113）表面原子结构的低能电子衍射研究

A LEED study of atomic structure on si ( 113 ) surface

TEM中电子衍射相机长度的实验分析及计算

Experimental Analysis and Calculation of Electron Diffraction Cameral Length in TEM

用会聚束电子衍射对SiC中多型鉴定

Identification of polytypes in SiC with convergent beam - electron diffraction technique

电子衍射条件对Si（111）外延时反射式高能电子衍射强度振荡的影响

The effect of electron diffraction conditions on RHEED intensity oscillations during si ( 111 ) MBE

用低能电子衍射谱计算过渡金属吸附CO的表面结构

The surface structure calculated of CO adsorbed on the transition metals surfaces with low energy electron diffraction spectra

通过热失重，红外光谱、X－射线衍射、电子衍射和接触角测定等，研究聚合物结构与性能。

The polymer structure was investigated by using FTIR , X-ray diffraction , electron diffraction and contact angle measurements .

中子散射可以说是对X射线衍射和电子衍射的一个重要的和不可缺少的补充。

We can say that neutron scattering is an important and necessary complement for X-ray diffraction and electronic diffraction .

Si（111）-2×1重构表面的自动张量低能电子衍射研究

Study of Si ( 111 ) - 2 × 1 Reconstruction by Automated Tensor Low Energy Electron Diffraction

借助透射电镜，电子衍射和BET法对产物进行表征。

Transmission electron micrograph , electron diffraction and BET were adopted to characterize the products .

中子以它特有的性质，使它成为继X射线和电子衍射之后的又一研究微观物质结构的有效方法。

After X-ray and electronic diffraction , neutron becomes another effective method to study micro substance structure because its special nature .

Si衬底上分子束外延Ge，Si时的反射式高能电子衍射强度振荡观察

RHEED intensity oscillations in the process of molecular beam epitaxy growth of Ge and Si on Si substrates

本文用X射线及电子衍射结构分析对金刚石和石墨单晶表面覆盖沉积铬进行了研究。

The cover-deposition chromium on diamond and graphite single crystal surfaces using X-ray and electron diffraction structure analysis technique have been studied .

并用X射线衍射、电子衍射及电子显微镜、俄歇能谱和光散射等技术研究了这些准周期超晶格的微结构。

The structures of these superlattices were characterized by x-ray and electron diffractions , electron microscopy , Auger spectroscopy and light scattering .

对腐蚀产物进行了X射线衍射、电子衍射、电子探针分析及金相检查。

Corrosion products were analyzed by X - ray diffraction , electron diffraction and electron probe analyses as well as by metallographic techniques .

Si（100）和（111）面和在其上Ni分子束外延的反射高能电子衍射研究

Study of si ( 100 ) and ( 111 ) surfaces and molecular beam epitaxy of Ni on them by RHEED

利用TEM和电子衍射图谱分析，研究了新型陶瓷刀具材料JX－2－I的界面微观结构。

Interfacial Microstructure of advanced ceramic tool material JX-2-I have been studied with TEM and elec-tron diffraction spectrum .

采用类凝胶超临界流体干燥法制备了超细MoCoK催化剂，并运用TEM和选区电子衍射技术对制得的催化剂进行了表征。

Ultrafine Mo Co K catalysts were prepared by the " gel like " method followed by supercritical fluid drying technique .

气相电子衍射和SF6分子中电荷的再分布

Gas Electron Diffraction and Charge Redistribution in SF_6 Molecule

结合电子衍射和能谱分析结果，证实了氧化晶须为（Fe，Mn）Cr＿2O＿4。

The results of electron diffraction and EDAX analyses have revealed that the oxide whisker is ( Fe , Mn ) Cr_2O_4 .

Y-Ba-Cu-O系高Tc超导材料的电子衍射分析

Electron diffraction analysis of Y-Ba-Cu-O system high Tc superconducting materials

电子衍射花样表明过量Ti形成了超点阵，Ti在点阵中形成钉扎。

The electron diffraction patterns show that the over-stoichiometric Li forms superlattice structure . Residual Ti atoms act as pins in the lattice .

利用X射线衍射（XRD）和俄歇电子衍射（AES）观察了表面膜的化学成分及结构。

The structure and chemical compositions of the surface oxide film were investigated by XRD and Auger electron spectrometry ( AES ) .

本文采用背散射电子衍射（EBSD）及透射电镜（TEM）技术对拉伸变形单晶铝（[110]方向平行于拉伸轴）的显微组织进行了表征，直接对比了两种分析手段所得结果的异同。

Tensile deformation microstructure of aluminum single crystal was characterized by TEM and EBSD techniques .

通过XRD、电子衍射图谱等分析方法证明了样品晶型为α型。

By methods of XRD and electron diffraction pattern , crystal form of the sample is proved to be of α - form .

合金中的沉淀相经电子衍射鉴定为Ni3Zn（22）和Mg2Zn（11）。

The precipitated phases in this alloy were identified as Mg_2 Zn_ ( 11 ) and Ni_3 Zn_ ( 22 ) by means of electron diffraction .

选区电子衍射（SAD）和X射线能量色散谱（EDAX）分析证实，壳-芯结构是由晶粒中含杂质Si的分布不均匀引起。

SED and EDAX results show that the shell-core structure may be caused by the nonuniform distribution of silicon impurities in grains .

利用电子衍射照片确定ZrO2薄膜的织构状态

Old photos determination of texture state of thin film zro_2 by electron diffraction pattern