互补金属氧化物半导体
- 名CMOS;complementary metal-oxide-semiconductor
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CMOS图像传感器是一种采用CMOS(ComplementaryMetal-oxide-semiconductor,互补金属氧化物半导体)工艺制造的图像传感器。
CMOS image sensor is a manufactured image sensor using CMOS ( Complementary Metal-oxide-semiconductor ) technology .
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n阱互补金属氧化物半导体工艺
N well cmos process
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蓝宝石上互补金属氧化物半导体微处理机孔雀石绿-H2O2体系动力学光度法测定微量溴化物
Kinetic-spectrophotometric method for the determination of trace amount of bromide with malachite green-hydrogen peroxide
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同时,还展示了用标准互补金属氧化物半导体(CMOS)技术,实现硅基光子器件和电子器件在同一基片上微纳集成的巨大前景。
The perspective of micro / nano scale monolithic integration of optical devices and electronic devices on a single chip by standard complementary mental oxide semiconductor ( CMOS ) technologies is also presented .
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为了减小深亚微米互补金属氧化物半导体(CMOS)电路待机模式下的泄漏功耗,须寻找使电路泄漏功耗最低的最小泄漏向量(MLV)。
To reduce power leakage of deep sub-micron metal-oxide-semiconductor ( CMOS ) circuit in standby mode and search the minimum leakage vector ( MLV ) producing minimum leakage power , a linear programming ( LP ) model based on leakage power library was proposed .
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介绍了一种红外焦平面阵列(IRFPA)互补金属氧化物半导体(CMOS)读出集成电路(ROIC)的研制方案,叙述了读出电路的电路原理及工作时序、电路参数设计、版图设计及工艺分析。
A development of infrared focal plane array ( IRFPA ) complementary metal oxide semiconductor ( CMOS ) readout integrated circuit ( ROIC ) is introduced . The circuit principle of ROIC , time sequence of multiplexer , circuit parameter , layout design and technology analysis are described .
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这件工艺品用宝石装饰。蓝宝石上互补金属氧化物半导体工艺
The work is jeweled with precious stones . cmos on sapphire process
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蓝宝石硅片集成电路蓝宝石上硅互补金属氧化物半导体工艺
SOSIC ( Silicon-on-Sapphire Integrated Circuit ) sos cmos process
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互补金属氧化物半导体焦平面阵列输入电路1/f噪声的优选
1 / f optimization of a complementary metal oxide semiconductor focal plane array input circuit
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硅栅自对准结隔离互补金属氧化物半导体
Silicon gate self aligned junction isolated cmos
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互补金属氧化物半导体器件
Complementary metal oxide semiconductor device
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硅栅互补金属氧化物半导体
Silicon gate complementary MOS
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声音晶片的全部制程,是完全相容于互补式金属氧化物半导体(cmos)的工业标准制程。
The entire process of building a sound chip is fully compatible with the standard industry process for semiconductor manufacturing , called complementary metal oxide semiconductor , or CMOS .
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本论文所述设计中,基于0.6微米互补型金属氧化物半导体(CMOS)工艺,设计并实现一种10-bit高性能、低功耗的流水线模拟-数字转换器(ADC)。
Proposed in this thesis , base on 0.6 μ m CMOS technology , a 10-bit high performance low power pipelined analog-to-digital converter is designed and implemented .
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为了实现10位高性能和低功耗的流水线模拟数字转换器ADC,提出了基于0.6微米互补型金属氧化物半导体(CMOS)混合信号工艺的电路设计方法。
In order to implement an analog-to-digital converter ( ADC ) with pipeline structure of 10-bit high performance and low power dissipation , a design method based on 0.6 μ m complementary metal-oxide-semiconductor ( CMOS ) mixed signal technology was proposed .
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由于采用开关电流技术,该系统电路可以直接采用标准的数字互补型金属氧化物半导体(CMOS)工艺来实现,便于模、数混合集成,易于超大规模集成电路(VLSI)的制作。
Since the switched current technology is employed , this system is fully compatible with a standard digital Complementary metal oxide semiconductor ( CMOS ) technology , and is easily to be integrated in mixed analog digital system and implemented in very large scale integrated circuit ( VLSI ) .
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该模数转换器已在标准数字互补性金属氧化物半导体工艺下实现。
The chip was fabricated in standard digital complementary metal - oxide - semiconductor process .
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互补对称金属氧化物半导体阵列
Complementary symmetry MOS array
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互补高性能金属氧化物半导体结构
Complementary high performance mos
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稳态、瞬态X射线辐照引起的互补性金属-氧化物-半导体器件剂量增强效应研究
Study of relative dose-enhancement effects on CMOS device irradiated by steady-state and transient pulsed X-rays
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特别是HfO2和ZrO2被普遍认为是替代传统栅极材料SiO2成为下一代互补型金属-氧化物-半导体(CMOS)器件的高K栅介质材料,而HfO2薄膜在CMOS器件中已得到了成功应用。
Especially , they are regarded as the substitution of conventional SiO2 to be gate dielectrics in the next generation of complementary metal-oxide-semiconductor ( CMOS ) devices .