reticle

An image processing system computes the size of the reticle image and the focal length .

图像处理系统将计算十字线的像的尺寸和焦距。

A new method is presented to measure movement displacement of two-dimensional exact worktable when applying grating as standard reticle .

利用计量光栅的栅距作为基准刻线，对二维精密工作台的运动位移进行测量，提出了一种新的位移测量方法。

The aBsorption of small farms into a Big one field stop reticle combination

合并小农场成一大农场视场光阑-调制盘组合

A reticle method for exactly measuring Gaussian optical spot parameter

精确测量高斯光斑参数的调制盘方法

Single linear CCD linearity collimator based on M shape reticle

基于M型分划丝的单线阵CCD直线度准直仪

In this paper , we present a reticle method for exactly measuring Gaussian optical spot parameter .

本文介绍一种精确测量高斯光斑参数的调制盘方法，它能快速和精确的测量高斯光斑参数。

Development of reticle management system in 0 . 8 ~ 1 μ m wafer stepper

0.8～1微米分步重复投影光刻机掩模库研制

To the radar / fire control system , the aiming reticle and its simulation principle are emphasized .

对于雷达火控系统，着重讨论了平显瞄准环的仿真原理。

Algorithm for exposure unit set of LSI reticle figure

LSI版图曝光单元集的算法

Get the detected reticle deviating angle value by computer analysis , thereby realizing the calibration .

经计算机分析得出被检分划板的偏离角度值，从而实现校准。

A sliding mode synchronization controller of the reticle stage was added to the conventional PID control system .

在常规PID控制系统基础上增加了掩模台精动滑模同步控制器。

The second chapter introduces the overall design principles and methods . The measurement parameters and design of reticle are also referred .

第二章介绍了检查仪系统的总体设计思想和方法，测量的原理和课题所要检测的参数。

Introduce the New Reticle of Metal Foil

介绍一种新型的金属箔分划板

Active jamming of an infrared seeker with amplitude modulation reticle

调幅式调制盘红外导引头的主动干扰

You could see their faces plainly in the reticle , and they weren 't happy .

你可以从十字准星里看到他们面无表情，他们显得并不高兴。

The processing technologies , testing method , abrasive and accessory materials used in processing procedure of reticle are introduced in the paper .

本文主要介绍调制盘的加工工艺与测试方法以及加工过程中所用的磨料与辅料。

Slanted opaque bar reticle oblique rectifying table with curved side

不透明斜条形调制盘侧弯矫形用斜面手术台

Multi-feature Fusion Recognition and Sub-pixel Locating Algorithm of Sighting Reticle

瞄准分划的多特征融合识别与亚像素定位算法

The modulation curve , error signal profile , blind area and spatial filter characteristic of the reticle are given in this paper .

红缨5号调制盘有很多特点。本文分析了这一调制盘的调制曲线、误差信号分布曲线、盲区及空间滤波性能。

Thermal Distortion of EUV Reticle during Exposure

EUV掩模版在曝光过程中的热变形

It has range-finding reticle and built-in compensator for bullet drop .

具有测距标线和内置的子弹下降补偿。

The matching conditions between the transparent radial strip of the reticle and the blur circle of target image is then predicted .

从而预示出调制盘透光辐条和目标像弥散圆的匹配情况。

Act of moving a mask or reticle to match up alignment marks . Hot plate with silicon wafer lowered to heating position .

对准，调整掩模和晶片之间的位置。加热板与矽晶圆降低至加热位置。

Functioning as a loadport the system can accept a reticle dual pod directly from the scanner for transfer to the mask cleaning tool .

InSync系统则可直接从掩膜板用容器内接受掩膜板，并直接将其传送到掩膜清洗工具上去。

The Tritium illuminates the aiming point in total darkness , and the fiber-optic self-adjusts reticle brightness during daylight according to ambient light conditions .

三重氢照明被用在完全黑暗状态，而视觉纤维（自动调节）用在白天或者可以说在有外界光线的情况下。

Recent progress in technology of wafer stage and reticle stage used in step-and-scan lithography system is introduced , and the overlay accuracy and the accuracy of the overall system are analyzed .

着重介绍了当前国外步进扫描投影光刻机的工件台和掩模台的发展状况，并对套刻精度和整机精度进行了分析。

After the SVM data-training , the Post-OPC hotspots on reticle can be predicted without defining any types of hotspot .

在支持向量机中进行训练后，能进行光学邻近校正后版图的热点检测且无需定义热点类型。

The system through the five prism method to the detected parallel light pipe fo defocus detection , again using the vibrating slit assembly of the detected collimator reticle to capture image center position energy .

该系统通过五棱镜法对被检平行光管进行离焦检测，再利用振动狭缝组件对被检平行光管分划板像的中心位置进行能量的捕捉。

At a repetition rate nearly equal to the carrier frequency of the reticle system , the jamming source will disturb the target 's signal received by the seeker , and make the seeker lose the target .

而重复频率近似等于调制盘系统调制波形载频的光脉冲会干扰导引头接收到的目标信号，使导引头失去目标。

Suppose a optical spot is of a Gaussian intensity distribution and is modulated by a sectored reticle , then the parameters of this optical spot can be exactly derived from measurements of the harmonic amplitude spectrum .

假若光斑的强度分布是高斯模式，经扇形调制盘调制，测量主频的各次谐波振幅，能推算出高斯光斑的参数。