mbist

MBIST ( memory built-in self-test ) is very effective in testing embedded memories .

存储器内建自测试（MemoryBuilt-InSelf-test，MBIST）是一种有效的测试嵌入式存储器的方法。

As a kind of Design for Test , Built in circuit , MBIST ( Memory Built-in Self-Test ) can test the memory .

作为可测性设计的一种，MBIST（MemoryBuilt-InSelf-test）是在电路内部置入测试电路以对Memory进行测试，它的好处是可以节省测试时间；

As a kind of the structured design for test techniques , memory built-in self-test ( MBIST ) is a cost-effective approach for the embedded RAM testing .

作为结构化可测性设计策略（structureddesignfortest）的一种，存储器内建自测试（MemoryBuilt-InSelf-test，MBIST）已经成为当前针对嵌入式随机存储器（E-RAM）测试的一种经济有效的途径。

Memory Build-In Self Diagnosis ( MBISD ) in Memory Build-In Self Test ( MBIST ) technology is introduced , which is widely used in the design of testability of embedded memories .

针对大规模嵌入式存储器可测性设计技术存储器内建自测试（MBIST）中的故障诊断问题，介绍了MBIST设计的扩展功能存储器内建自诊断（MBISD）。