ATPG

For substituting the test vectors generated by the circuit under test for the pseudo-random vectors supplied by a LFSR , this paper proposes an ATPG algorithm based on genetic algorithm .

本文针对由被测电路自己产生测试向量取代LFSR伪随机向量，提出一种基于遗传算法的自动测试向量生成算法。

Research of Parallel ATPG Algorithm and Prototype System Design

并行ATPG算法理论与原型系统设计技术研究

Fault simulation is an important part of ATPG .

故障模拟是数字电路测试的重要组成部分。

Methods for Enhancing ATPG Efficiency of Dynamic Current Testing

提高瞬态电流自动测试生成时间效率的方法

Experimental results show that about 70 % of ATPG time is cut down .

模拟实验结果表明，测试生成算法执行时间大约减少了70%。

Research in Low-power ATPG technology is the main work in this dissertation .

本文主要对低功耗测试向量生成技术进行研究。

High test coverage is achieved through ATPG faults simulation .

通过对错误仿真分析表明，扫描测试达到了较高的测试覆盖率。

And effective ATPG or testability analysis is carried out based on it .

然后在此模型上进行测试产生或可测试性分析。

The influence of embedded memory on ATPG in SoC Design

SoC设计中嵌入存储器对ATPG的影响

A new automatic test pattern generation ( ATPG ) methodology based on chaotic neural network method is described .

阐述了一种基于混沌神经网络的自动测试生成（ATPG）算法。

True Lies A Summary on the Theory of ATPG

对并行测试生成理论的一点综述

Testability Design of Wireless Chip Based on ATPG

基于ATPG的无线接入芯片的可测试性设计

With the development of the VLSI technology and the improvement of computer performance , parallel ATPG is necessary and feasible .

随着VLSI技术的发展和计算机性能的提高，并行测试生成系统不仅必需而且可行。

ATPG For Digital Circuits Contain Memory Chips

含存储器数字电路系统的自动测试生成

Formal Verification and ATPG Using Boolean Satisfiability Problems

在形式验证和ATPG中的布尔可满足性问题

In this paper we describe a robust and efficient algorithm for ATPG & the algorithm for test pattern generation using satisfiability .

描述一种新的健全高效的测试向量自动生成方法&测试向量生成的可满足性算法。

An ATPG Engine for Formal Verification

一个适于形式验证的ATPG引擎

High-level ATPG algorithm for IC

IC高层自动测试矢量生成算法

DFT based on ATPG is utilized to RSIC CPU

基于ATPG的可测性设计在RSICCPU的应用

In contrast with existing algorithms for ATPG , the proposed algorithm relies on the optimized searching algorithm for effectively pruning the searching space .

与现有的测试向量生成算法相比，满足性算法是一种有效改进搜索空间的搜索算法，运用几种简化技术，进一步改进故障诊断的方法。

In the paper , we describe a efficient algorithm for ATPG & SAT ATPG algorithm based on Satisfiability ( SAT ) .

本文介绍了可满足性的测试向量生成（SAT-ATPG）算法。

OBDD ( Ordered Binary Decision Diagram ) is widely used in formal verification and VLSI automatic test pattern generation ( ATPG ) .

编序的二元判决图（OBDD）在电路测试和逻辑验证等方面具有广泛的应用。

We use ATPG tool " TestGen " generating test set with an X value and take a fault simulation with the fault simulator HOPE .

我们利用ATPG工具“TestGen”产生带不确定位X值的测试集，用故障模拟器HOPE进行故障模拟。

This dissertation focuses on automatic test generation ( ATPG ) algorithms for very large-scale integrated circuits at register-transfer-level ( RTL ) .

本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。

Reliability of digital circuits is very important and testing is its significant guarantee , while Automatic Test Pattern Generation ( ATPG ) is the major task of the test .

数字电路的可靠性有着至关重要的影响，测试是其重要保证，测试向量的自动生成（ATPG）在数字电路的测试中占有重要地位；

Some technologies about the testing and diagnosis of digital circuit are discussed , including fault model , fault simulation , fault compression , and the scale of testability and ATPG .

讨论了电路的测试及故障诊断中的一些问题，主要包括故障模型、故障仿真、故障压缩及可测试性度量与测试矢量生成算法（ATPG），并研究了电路测试技术的发展趋势。

The theorem and conditions on identifying undetectable faults can be acquired by applying combinational ATPG to ILA in sequential circuits ;

对时序电路的迭代逻辑阵列（ILA）施加组合ATPG（自动测试模式生成），可得到不可测故障识别的定理和条件，其条件针对故障电路给出。

The automatic test vector generation method based on fault simulation is described , and the whole procedure of ATPG of sequential circuits is analyzed , fault simulator-HOPE as an example .

本文阐述了基于模拟的自动测试生成方法，以故障模拟器&HOPE为例分析了整个时序电路自动测试生成过程。

The analyses reveal that , compared with traditional tightly coupled mode parallel ATPG algorithms , loosely coupled mode parallel ATPG algorithms can reduce time and memory overhead in theory .

分析表明，和传统的紧耦合模式的并行ATPG算法相比，松耦合模式的并行ATPG算法能够减少时间和存储开销。

This paper presents a preimage computation approach used in unbounded model checking . The approach combines ATPG and SAT engines effectively and makes full use of their respective advantages .

提出一种无界模型检验的前像计算方法，该方法有效地结合ATPG和SAT引擎，充分利用引擎各自的优点。