ATPG
- 网络自动测试模式产生;自动测试图形生成;自动测试程序生成;测试向量自动生成;自动测试图形向量生成
![ATPG](../cache/740677.jpg)
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For substituting the test vectors generated by the circuit under test for the pseudo-random vectors supplied by a LFSR , this paper proposes an ATPG algorithm based on genetic algorithm .
本文针对由被测电路自己产生测试向量取代LFSR伪随机向量,提出一种基于遗传算法的自动测试向量生成算法。
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Research of Parallel ATPG Algorithm and Prototype System Design
并行ATPG算法理论与原型系统设计技术研究
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Fault simulation is an important part of ATPG .
故障模拟是数字电路测试的重要组成部分。
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Methods for Enhancing ATPG Efficiency of Dynamic Current Testing
提高瞬态电流自动测试生成时间效率的方法
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Experimental results show that about 70 % of ATPG time is cut down .
模拟实验结果表明,测试生成算法执行时间大约减少了70%。
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Research in Low-power ATPG technology is the main work in this dissertation .
本文主要对低功耗测试向量生成技术进行研究。
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High test coverage is achieved through ATPG faults simulation .
通过对错误仿真分析表明,扫描测试达到了较高的测试覆盖率。
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And effective ATPG or testability analysis is carried out based on it .
然后在此模型上进行测试产生或可测试性分析。
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The influence of embedded memory on ATPG in SoC Design
SoC设计中嵌入存储器对ATPG的影响
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A new automatic test pattern generation ( ATPG ) methodology based on chaotic neural network method is described .
阐述了一种基于混沌神经网络的自动测试生成(ATPG)算法。
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True Lies A Summary on the Theory of ATPG
对并行测试生成理论的一点综述
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Testability Design of Wireless Chip Based on ATPG
基于ATPG的无线接入芯片的可测试性设计
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With the development of the VLSI technology and the improvement of computer performance , parallel ATPG is necessary and feasible .
随着VLSI技术的发展和计算机性能的提高,并行测试生成系统不仅必需而且可行。
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ATPG For Digital Circuits Contain Memory Chips
含存储器数字电路系统的自动测试生成
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Formal Verification and ATPG Using Boolean Satisfiability Problems
在形式验证和ATPG中的布尔可满足性问题
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In this paper we describe a robust and efficient algorithm for ATPG & the algorithm for test pattern generation using satisfiability .
描述一种新的健全高效的测试向量自动生成方法&测试向量生成的可满足性算法。
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An ATPG Engine for Formal Verification
一个适于形式验证的ATPG引擎
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High-level ATPG algorithm for IC
IC高层自动测试矢量生成算法
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DFT based on ATPG is utilized to RSIC CPU
基于ATPG的可测性设计在RSICCPU的应用
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In contrast with existing algorithms for ATPG , the proposed algorithm relies on the optimized searching algorithm for effectively pruning the searching space .
与现有的测试向量生成算法相比,满足性算法是一种有效改进搜索空间的搜索算法,运用几种简化技术,进一步改进故障诊断的方法。
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In the paper , we describe a efficient algorithm for ATPG & SAT ATPG algorithm based on Satisfiability ( SAT ) .
本文介绍了可满足性的测试向量生成(SAT-ATPG)算法。
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OBDD ( Ordered Binary Decision Diagram ) is widely used in formal verification and VLSI automatic test pattern generation ( ATPG ) .
编序的二元判决图(OBDD)在电路测试和逻辑验证等方面具有广泛的应用。
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We use ATPG tool " TestGen " generating test set with an X value and take a fault simulation with the fault simulator HOPE .
我们利用ATPG工具“TestGen”产生带不确定位X值的测试集,用故障模拟器HOPE进行故障模拟。
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This dissertation focuses on automatic test generation ( ATPG ) algorithms for very large-scale integrated circuits at register-transfer-level ( RTL ) .
本文主要是对大规模、超大规模集成电路寄存器传输级(RTL)的自动测试产生算法进行研究。
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Reliability of digital circuits is very important and testing is its significant guarantee , while Automatic Test Pattern Generation ( ATPG ) is the major task of the test .
数字电路的可靠性有着至关重要的影响,测试是其重要保证,测试向量的自动生成(ATPG)在数字电路的测试中占有重要地位;
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Some technologies about the testing and diagnosis of digital circuit are discussed , including fault model , fault simulation , fault compression , and the scale of testability and ATPG .
讨论了电路的测试及故障诊断中的一些问题,主要包括故障模型、故障仿真、故障压缩及可测试性度量与测试矢量生成算法(ATPG),并研究了电路测试技术的发展趋势。
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The theorem and conditions on identifying undetectable faults can be acquired by applying combinational ATPG to ILA in sequential circuits ;
对时序电路的迭代逻辑阵列(ILA)施加组合ATPG(自动测试模式生成),可得到不可测故障识别的定理和条件,其条件针对故障电路给出。
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The automatic test vector generation method based on fault simulation is described , and the whole procedure of ATPG of sequential circuits is analyzed , fault simulator-HOPE as an example .
本文阐述了基于模拟的自动测试生成方法,以故障模拟器&HOPE为例分析了整个时序电路自动测试生成过程。
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The analyses reveal that , compared with traditional tightly coupled mode parallel ATPG algorithms , loosely coupled mode parallel ATPG algorithms can reduce time and memory overhead in theory .
分析表明,和传统的紧耦合模式的并行ATPG算法相比,松耦合模式的并行ATPG算法能够减少时间和存储开销。
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This paper presents a preimage computation approach used in unbounded model checking . The approach combines ATPG and SAT engines effectively and makes full use of their respective advantages .
提出一种无界模型检验的前像计算方法,该方法有效地结合ATPG和SAT引擎,充分利用引擎各自的优点。