c1s

The analysis of the x ray photoelectron spectra ( XPS ) of C1s core level of the thin films shows the sp 3C content in the films is about 40 % .

x射线光电子能谱（XPS）分析显示薄膜中的sp3碳含量为40%左右。

The maximum N atom content in the films reaches 0.47 and the binding energy ( BE ) of C1s and N1s photoelectron varies with deposition conditions , shifting between 2.41 and - 1.7 ?

薄膜中的最大氮原子含量达到0.47，C1s和N1s电子的结合能产生了+2.41～-1.7eV的移动，移动的大小取决于制备条件。

Combining the X-ray photoelectron spectrum ( XPS ) analysis and CAFM , we have further studied the relationship between the conductance of SAM and the C1s binding energy of the terminal group of the molecule .

结合X射线光电子能谱，研究了末端基团中碳原子的结合能与相应硫醇分子电导的关系。

A curve fitting technique was applied to separate C1s peak in the XPS spectra of the sample film into sp3 peak and sp2 peak , for which the percentage of sp3 is 55 % .

利用曲线拟合技术在C1s电子能谱图中拟合出sp3峰与sp2峰，并计算出样品薄膜中sp3碳的相对含量为55%；