石英玻璃片

应用射频磁控溅射方法分别在抛光硅片和石英玻璃片上分层沉积了GaAs/SiO2纳米薄膜。

GaAs / SiO_2 films were deposited on the substrates of quartz glass and silicon slices layer by layer by radio frequency ( RF ) magnetron sputtering technique .

采用射频磁控溅射方法，在石英玻璃基片上制备了Ge2Sb2Te5相变薄膜。

Using a radio-frequency magnetron sputtering method , Ge_2Sb_2Te_5 films were grown on quartz substrates at room temperature .

用椭偏仪和透射光谱分别测量并计算了制备在Si（111）、石英玻璃基片上薄膜的折射率。

The refractive index of the films fabricated on the Si ( 111 ) and fused quartz glass was measured and calculated by the ellipsometry and optical transmission spectra respectively .

本文采用射频磁控溅射方法在n-Si（100）、石英玻璃基片上外延生长Ge2Sb2Te5相变存储薄膜，对薄膜的热力学性能、表面形貌、组织结构、光学特性进行了系统的检测与分析；

In this study , Ge_2Sb_2Te_5 thin films have been deposited on n-Si ( 100 ) and quartz substrates by radio frequency magnetron sputtering . The influence of substrate temperture and sputtering pressure is emphasized .

利用模拟空间热循环温度场设备对太阳能电池中石英玻璃盖片/硅橡胶粘合剂/硅晶片胶接结构进行了真空热循环试验（123～403K，10-5Pa）。

The vacuum thermal cycling tests ( 123 ~ 403K , 10 - 5 Pa ) were carried out on the bonding structure of quartz glass cover / silicon rubber adhesive / silicon crystalline in solar battery , using the system simulating the temperature filed of thermal cycling in space .