白光干涉仪

  • 网络white light interferometer
白光干涉仪白光干涉仪
  1. 采用扫描式迈克尔逊白光干涉仪对应力场引起的高双折射保偏光纤(PMF)内部的分布式偏振模式耦合进行定量测试和理论分析。

    The distributed polarization mode coupling caused by stress field in high-birefringence polarization-maintaining optical fiber ( PMF ) was measured and analyzed using a scanning Michelson white light interferometer .

  2. 白光干涉仪位移测量的光纤遥传

    An Optical Fibre Remote Sensing System of Displacement Generated by White Light Interferometer

  3. 详细阐述了白光干涉仪的设计过程,该设计主要包括驱动电路、光电IV转换以及电压放大3个模块。

    The white light fiber optic interferometer is designed . It includes driving electrocircuit , photoelectricity I-V transformation and voltage amplifier .

  4. 通过理论计算得到了构成光纤FP腔的光纤端面的镀膜参数要求,深入的分析了白光干涉仪光纤FP传感器的模型,并设计出了一套观察白光干涉现象的实验装置。

    We get the film reflectivity of fiber-optic Fabry-Perot cavity by calculation , and designed a experimental device to observe white-light interferometry .

  5. 以光纤偏振干涉系统为传感干涉仪,以数字式扫描Michelson干涉仪为参考干涉仪,解释了白光干涉仪的双干涉系统理论。

    Clarify that fiber polarization interferometer functions as sensing interferometer , and digital scanning Michelson interferometer as reference interferometer , which explains the double interferometer system theory of white-light interferometry .

  6. 光纤白光干涉仪是使用波长为1310nm的半导体发光二极管的相位调制型光纤传感器,可用于压力、温度和应变的测量。

    White-light fiber interferometer is a kind of phase modulated fiber-optic sensor , which uses 1 310 nm semiconductor LED .

  7. 应用多模干涉器件的白光干涉仪研究

    Study on White-light Interferometer with Multi mode Interferometry Device

  8. 光纤寄生偏振耦合白光干涉仪光学系统设计基于白光干涉的分布式偏振耦合测试系统

    Research of Optical System in Fiber Polarization Coupling Analyzer Based on White-light Interferometry

  9. 多光源白光干涉仪的最佳波长组合

    The Optimum Wavelength Combination in Multi-Light-Source White-Light Interferometer

  10. 白光干涉仪中多波长值的优化选择

    Optimum Selection of Multi-wavelength in White-light Interferometer

  11. 使用光纤白光干涉仪测一维形变实验

    Measuring one-dimensional deformation using white-light fiber interferometer

  12. 光纤白光干涉仪的研究

    Research on Fiber White-light Interferometer

  13. 在白光干涉仪中,白光光源的参数决定了干涉条纹的分布,对中心条纹的识别精度产生直接影响。

    In white-light interferometer , the parameters of white-light sources influence the shape of the interferogram and the central fringe identification .

  14. 分析了白光干涉仪的原理、结构以及干涉条纹特点,进行了保偏光纤环的扫描测量。

    The quality of the first polarization maintaining fiber ring is much better than the quality of other fiber rings through the scanning test using the measurement system .

  15. 基于因光纤通信发展而研制的多模干涉器件的原理和特点,提出一种结合多模干涉器件的白光干涉仪,并讨论了其典型应用。

    Base on the principle and performance of the multi mode interferometry ( MMI ) device , the white light interferometer with MMI device is presented , the typical application is researched .

  16. 用由光纤串接的双白光迈克尔逊干涉仪所组成的干涉系统可以实现位移量的遥测。

    Remote measuring of displacement can be carried out by using interferometric system composed of double white light Michelson interferometer which is connected in series by optical fibre .

  17. 扫描电镜和三维白光干涉表面形貌仪的结果表明,金刚石薄膜和类金刚石薄膜表面质量较好。

    The results of SEM and 3D surface topography indicate that diamond and DLC films have good quality coating .

  18. 采用基于扫描白光干涉原理的轮廓仪法,能够检测到硅片的亚表面裂纹是否存在的信息,进而根据此信息可以定性地判断是否实现了延性域磨削;

    In order to identify the grinding mode , it is capable of measuring whether there are subsurface cracks of silicon wafers by using a 3D surface profiler based on scanning white light interferometry .