电子能谱

俄歇电子能谱（AES）及其在超导材料分析中的应用

Auger electron spectroscopy ( AES ) and it 's application in superconducting materials analysis

热丝CVD金刚石薄膜Auger电子能谱分析

Analysis of Auger Electron Spectroscopy about the Diamond Films Deposited by Filament CVD

X射线光电子能谱用X光电子能谱研究铱催化剂的表面性质

A X-ray photoelectron spectroscopy study of the surface properties of iridium catalysis

用俄歇电子能谱研究薄膜Cu2S/CdS太阳能电池

A study of cu_2s / cds solar cell by AES

TINx薄膜的特性和俄歇电子能谱分析

Characteristics of TiN_x Film and Analysis by Auger Electron Spectroscopy

利用飞秒含时光电子能谱研究Li2分子的波包动力学过程

A Study of the Wave Packet Dynamics of Li_2 Molecule with Femtosecond-Resolved Photoelectron Spectrum

经X-射线电子能谱鉴定为Fe2O3。

This metal oxide is Fe_2O_3as determined by X-ray photoelectron spectroscopy .

Pd/W/Si（111）双层膜界面X射线光电子能谱与俄歇电子能谱研究

XPS and AES study for pd / w / si ( lll ) bilayer interface

X光电子能谱成象分析法成象X射线光电子能谱定量法研究

Study on XPS imaging for quantitative analysis

溴原子与H2O反应的HeⅠ紫外光电子能谱（UPS）研究

He ⅰ Photoelectron Spectroscopic Studies of the Reaction of Bromine and Water

金刚石表面Ar离子溅射效应的电子能谱分析

An ESCA study on Ar ions sputtering effect on diamond surface

电子能谱研究生长高质量CeO2/Si异质结

Electron Spectroscopy Studies of the High Quality CeO_2 / Si Heterojunction Fabrication

合成TiN膜的俄歇电子能谱研究

Study on the Composition TiN Film by AES

利用扫描电镜、电子能谱、和X射线衍射仪对熔覆层的显微组织和物相构成进行分析，并在显微硬度仪和摩擦磨损实验机上对熔覆层进行硬度、摩擦性能测试。

The microstructure and phase analyses were performed by scanning electron microscope , energy-dispersive spectrometer and X-Ray diffraction .

新型角分辨XPS电子能谱仪

A New Electron spectrometer used for Angle - Resolved XPS

二次发射体MgO薄膜的俄歇电子能谱的研究

Study on secondary electron emitter MgO thin film with Auger electron spectroscopy

Si3N4/SiO2复合栅介质电离辐照的电子能谱分析

Analysis of X-ray photoelectron spectroscopy on Si_3N_4 / SiO_2 double-gate medium under irradiation

报道了10种杂氮硅三环类化合物的紫外光电子能谱（UPS）。

The Ultraviolet Photoelectron Spectra ( UPS ) of 10 silatranes are recorded in this paper .

Si（111）、Si（100）表面初期氧化的电子能谱研究

Studying the early stage of oxidation of the silicon ( 111 ) silicon ( 100 ) surface by AES and UPS

X光电子能谱表明，在Al－1.17%Cu合金氧化膜下的过饱和空位造成的空位坑中，有较大的Cu的偏聚。

X-ray photoelectron spectroscopy shows that there is Cu segregation in vacancy condensation pits below oxidation layer of Al-1.17 % Cu alloy sample .

用可见分光光度法、电子能谱、紫外和红外光谱等方法研究U在PrCl3作用下的固化成膜历程。

The dryness mechanism of urushiol catalyzed by PrCl_3 was studied by visible spectrophotometry , XPS , UV and IR .

在Si（100）基底上制备了Ti/TiN和Ni/TiN两种多层膜以及TiN单层膜，利用X射线衍射，WYKO表面形貌仪，俄歇电子能谱等对薄膜进行了分析。

Ti / TiN and Ni / TiN multilayered films and TiN single film were prepared on Si ( 100 ) wafers .

利用X光电子能谱（XPS）研究共聚物添加前后在煤粉表面元素含量的变化；

XPS applied to study the surface element content changes before and after the copolymer added .

对材料的特性进行了俄歇电子能谱、低角度X射线衍射、光荧光及拉曼光谱等分析测试。

Auger electron energy spectra , low angle X-ray diffraction , photo-luminescence and Raman spectra were measured to confirm the quality of the SLSs .

用电子能谱（ESCA）和红外光谱（IR）法对聚合物结构进行表征。

Structure of polymerized products was characterized by IR spectroscopy and ESCA measurement .

介绍了一台用于表面分析的俄歇电子能谱仪（AES）系统。

A system of Auger electron spectroscopy ( AES ) for surface analysis was presented .

苯并噻唑衍生物的气相HeI紫外光电子能谱（UPS）及量子化学研究

Studies on Derivatives of Benzothiazole by HeI Photoelectron Spectroscopy

通过X射线衍射（XRD）和俄歇电子能谱（AES）分析研究了薄膜的微结构；

Microstructures of thin films are characterized by X-ray Diffraction ( XRD ) and auger Electron spectroscopy ( AES ) .

X光电子能谱和红外光谱分析表明SixOyNz膜具有复杂的空间结构。

XPS and IR spectra show that Si_xO_yN_z films have complicated space structures .

X光电子能谱（XPS）对CdSe/Ti光电极表面组成及结构的研究

Studies on the surface composition and the structure of cdse / ti photoelectrode by X-ray photoelectron spectroscopy