test logic
- 网络测试逻辑
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Research on Test Logic Insertion of Scan Design
扫描设计中测试逻辑的研究
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At the same time , this topic has also designed the performance test logic for PLL according to its characteristic .
另外,本课题还根据锁相环的特点,设计了一种锁相环性能测试逻辑。
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Test logic of the electric equipment
电力设备的试验逻辑
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The code for the ServiceClassTest class , which is shown below , contains the test logic .
下面所示的是包含测试逻辑的ServiceClassTest类代码。
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It is very necessary that strictly test logic function DC electrical characteristics and AC electrical characteistics of the devices .
严格测试这些器件的逻辑功能和直流、交流参数是十分必要的。
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In This paper , based on analysis of the untested factors of the sequence cell , presents a design method , which the test logic inserted , before the scan design .
文中首先分析了时序元件的不可测因素,提出了扫描设计前增加测试逻辑的设计方法。
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Then , the statistical software testing based project-Markov Test Logic ( MaTeLo ), and together with those related technologies used in MaTeLo is introduced .
文中介绍了基于统计软件测试的欧盟项目中有关的主要技术。
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In this paper , the test logic architecture of Boundary-Scan and its test principles are introduced , and the processes in developing the software for the Boundary-Scan system are also emphasized .
文章介绍了边界扫描的基本结构和测试原理,并重点介绍了开发边界扫描测试系统软件的流程;
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Detailed description models of functional requirements are established by refining functional requirements with use case diagrams , activity diagrams and state diagrams . Also , test logic is proposed in test case . A generation method for test logic is introduced based on activity diagrams of requirement model .
通过使用用例图、活动图和状态图将功能需求进行细化建立了详细的功能需求描述模型;在测试用例中提出了测试逻辑概念,给出了基于需求模型的活动图生成测试逻辑的方法。
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The encapsulation of the test suite logic in the decision scripts
在决策脚本中封装测试套件逻辑
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As a result , you can test the logic without accessing the GUI components in the view .
正因为这样,才能够测试逻辑而无需访问视图中的GUI组件。
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After all , the goal is to test the logic in the toEuros () method , not whether the server is sending the correct values .
毕竟,测试的目标是toEuros()方法中的逻辑,而不是服务器是否发送正确的值。
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The multiple-valued instrument made according to the proposed design can not only produce multiple-valued function signal , but also can test the logic level of multiple-valued logic circuits and analysis the logic function of c circuits .
根据设计的多值仪器不仅能产生多值函数信号,还可以测试多值逻辑电路的逻辑电平,分析多值逻辑电路的逻辑功能。
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Using Independent Variables for Simplifying Test Generation in Logic Networks
在逻辑网络中利用独立变量简化测试生成
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Implement and test the rule logic .
实现并测试数据逻辑。
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General specification and test method for logic analyzers
GB/T15471-1995逻辑分析仪通用技术条件和测试方法
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Digital IC test content includes logic functional test , test of DC parameters and test of AC parameters .
数字集成电路测试内容包括逻辑功能测试、直流参数测试和交流参数测试。
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Timer allows me to override getDefinition () 's run method and finish the test case 's logic within Timer instead .
Timer使我能够重写getDefinition()的run方法,在Timer内完成测试用例逻辑。
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This also means that XML-based IoC allows you to implement and test the business logic of each of the tasks of your workflow independently .
这也就意味着基于XML的IoC允许您对工作流程中的每一个任务的业务逻辑分别进行实现和测试。
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Currently , if you want to test your business logic that uses WebSphere business objects , you must deploy your code to a running server in order to run it .
目前,如果您希望测试使用WebSphere业务对象的业务逻辑,就必须将您的代码部署到一台正在运行的服务器中,以便运行它。
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Unlike other test techniques for logic functions of IC 's , I_ ( DDQ ) test is used to detect physical defects and process defaults of the circuit .
与其它主要用于检测逻辑功能的测试技术不同,IDDQ主要用于检测电路的物理缺陷和工艺故障。
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Since the POJO bean components have no Java dependencies on the application server , it is very simple to unit test the business logic in a plain Java SE or Eclipse environment .
由于这些POJObean组件在应用程序服务器上没有Java依赖项,因此在一个纯JavaSE或Eclipse环境中对业务逻辑进行单元测试非常简单。
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Auto - Generation of Universal Test Pattern for FPGA Logic Resources
FPGA逻辑资源测试图形自动生成方法
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Application of First Degree Boolean Difference for Test Generation of Combinational Logic Circuit
一阶布尔差分在组合逻辑电路测试生成中的应用
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Research on Test Technology of Combinational Logic Circuits in the Control System of Magnetic Bearings
磁力轴承控制系统中组合电路测试技术研究
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Integrated use of various methods in order to research conclusions stand the test of history and logic .
本文拟通过实证、比较、分类等研究方法综合运用,以求研究结论经得住历史和逻辑的验证。
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The institutional innovation needs non-openly test the new institution logic .
制度创新需要非公开试验新的制度逻辑;
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The information is divided into four parts , test context , test logic , test data and test result analysis .
最后对车载设备测试用例所需要描述的信息进行总结,将测试用例所描述的信息划分为测试环境、测试逻辑、测试数据以及测试结果分析四个部分。
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Study on Chaos Control and Chaotic Optimization with Its Applications in Test Generation for Combinational Logic Circuits
混沌控制与混沌优化及其在组合电路测试生成中的应用研究
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An auto-generating approach to the universal test pattern for FPGA logic resources is suggested .
提出一种通用FPGA逻辑资源测试图形自动生成方法。